MIL-PRF-19500-581 Semiconductor Device, Transistor, Npn, Silicon Amplifier, Types 2N4237, 2N4238, And 2N4239, Jan, Jantx, And JantxvThis specification covers the performance requirements for NPN, silicon, amplifier transistors. Three levels of product assurance are provided for each device type as specified in MIL-PRF-19500.

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MIL�PRF�19500/581C

4.5 Methods of inspection. Methods of inspection shall be as specified in the appropriate tables and as follows.

4.5.1 Pulse response measurements. The conditions for the pulse response measurement shall be as specified in

4.5.2 Input capacitance. This test shall be conducted in accordance with test method 3240 of MIL�STD�750,

except the output capacitor shall be omitted.

4.6 Delta requirements. The requirements for delta measurements for groups B, C, and E shall be as specified

below. (1)

Limits

Step

Inspection

Symbol

Unit

Method

Conditions

Min

Max

ĆICBO

Collector to base cutoff

3036

Bias condition D

100 percent of initial value or

current

10 nA dc whichever is greater.

(1)

VCB = 50 V dc

2N4237

VCB = 80 V dc

2N4238

VCB = 100 V dc

2N4239

ĆhFE2

IC = 250 mA dc

Forward current

3076

�25 percent change from

VCE = 1.0 V dc;

transfer ratio

initial recorded value.

(1)

Pulsed (see 4.5.1)

(1) Devices which exceed the table I limits for this test shall not be shipped.