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MIL-PRF-19500-606 Semiconductor Device, Field Effect Radiation Hardened \(Total Dose Only\) Transistors, N-Channel, Silicon, Types 2N7291, 2N7293, 2N7295, And 2N7297, Jantxvm, D, And R, And Jansm, D, And RThis specification covers the performance requirements for an N-Channel, enhancement-mode, MOSFET, radiation hardened \(total dose only\), power transistor. Two levels of product assurance are provided for each device type specified in MIL-PRF-19500.

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MIL-PRF-19500/606B
* 4.3.1 Gate stress test. Apply VGS = -30 V minimum for t = 250 µs minimum.
* 4.3.2 Single pulse avalanche energy (EAS).
IAS = IDM.
a.
b.
L = .1 mH.
2
EAS = .5 LIAS .
c.
Initial junction temperature = +25°C +10°C, -5°C.
d.
* 4.3.3 Thermal response ĆVSD measurement). The ĆVSD measurement shall be performed in accordance with
method 3161 of MIL-STD-750. The ĆVSD conditions (IH and VH) and maximum limit shall be derived by each vendor
from the thermal response curves (see figure 3) and shall be specified in the certificate of conformance prior to
qualification. The following parameter measurements shall apply:
Measuring current (IM) .......................................... 10 mA.
a.
Drain heating current (IH) ...................................... 4 A minimum.
b.
Heating time (tH) ................................................... 10 ms.
c.
Drain-source heating voltage (VH) ........................ 25 V.
d.
Measurement time delay (tMD) ............................... 30 to 60 µs.
e.
Sample window time (tSW) ..................................... 10 µs maximum.
f.
* 4.4 Conformance inspection. Conformance inspection shall be in accordance with MIL-PRF-19500 and as
specified herein. Alternate flow is allowed for JANTXV level conformance inspection in accordance with
MIL-PRF-19500.
4.4.1 Group A inspection. Group A inspection shall be conducted in accordance with appendix E, table V of
MIL-PRF-19500 and table I herein. (End-point electrical measurements shall be in accordance with the applicable
steps of table IV herein.)
* 4.4.2 Group B inspection. Group B inspection shall be conducted in accordance with the conditions specified for
subgroup testing in appendix E, table VIa (JANS) and table VIb (JANTXV) of MIL-PRF-19500, and herein. Electrical
measurements (end-points) and delta requirements shall be in accordance with the applicable steps of table IV
herein.
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