MIL-PRF-19500/608D
3.6 Electrical test requirements. The electrical test requirements shall be as specified in tables I and II.
* 3.7 Marking. Marking shall be in accordance with MIL-PRF-19500. The 1N6660CCT1 and 1N6660CAT1 are
directly substitutable for the 1N6660 and 1N6660R, respectively, and are preferred.
3.8 Workmanship. Semiconductor devices shall be processed in such a manner as to be uniform in quality and
shall be free from other defects that will affect life, serviceability, or appearance.
4. VERIFICATION
4.1 Classification of inspections. The inspection requirements specified herein are classified as follows:
a. Qualification inspection (see 4.2).
b. Screening (see 4.3).
c. Conformance inspection (see 4.4 and tables I and II herein).
4.2 Qualification inspection. Qualification inspection shall be in accordance with MIL-PRF-19500 and as specified
herein.
4.2.1 Group E qualification. Group E inspection shall be performed for qualification or re-qualification only. In
case qualification was awarded to a prior revision of the specification sheet that did not require the performance of
table III tests, the tests specified in table III herein that were not performed in the prior revision shall be performed on
the first inspection lot of this revision to maintain qualification.
4.3 Screening (JANS, JANTXV, and JANTX levels). Screening shall be in accordance with table E-IV of
MIL-PRF-19500 and as specified herein. The following measurements shall be made in accordance with table I
herein. Devices that exceed the limits of table I herein shall not be acceptable.
Screen
Measurement
(see table E-IV of
JANS level
JANTX and JANTXV levels
MIL-PRF-19500)
Method 4066 of MIL-STD-750, condition A,
Method 4066 of MIL-STD-750, condition A,
one pulse, tp = 8.3ms, IO = 0, VRWM = 0,
one pulse, tp = 8.3ms, IO = 0, VRWM = 0,
3b
IFSM = see 1.3 herein.
IFSM = see 1.3 herein.
3c
Thermal impedance (see 4.3.2)
Thermal impedance (see 4.3.2)
3d
Peak reverse energy test (see 4.3.3)
Peak reverse energy test (see 4.3.3)
4
Required
Not applicable
5, 8
Required
Not applicable
9, 10
Not applicable
Not applicable
VF1 and IR1
VF1 and IR1
11
12
See 4.3.1
See 4.3.1, t = 48 hours.
Subgroups 2 and 3 of table I herein, VF1
Subgroup 2 of table I herein, VF1 and IR1;
13
excluding thermal impedance;
and IR1, excluding thermal impedance;
ĆVF1 = ±50 mV (pk);
ĆVF1 = ±50 mV (pk);
ĆIR1 = ± 25 µA dc or 100 percent from the
ĆIR1 = ±25 µA dc or 100 percent from the
initial value, whichever is greater.
initial value, whichever is greater.
15
Required
Not applicable
* 4.3.1 High temperature reverse bias. Reverse bias conditions are as follows: Method 1038 of MIL-STD-750,
test condition A. VR = 36 V dc; TC = +125°C.
4
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