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MIL-PRF-19500-612 Semiconductor Device, Transistor, Pnp, Silicon, Power, Type 2N7372, Jan, Jantx, Jantxv, And JansThis specification covers the performance requirements for PNP, silicon, power transistors for use in high-speed power switching applications. Four levels of product assurance are provided as specified in MIL-PRF-19500.

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MIL-PRF-19500/612E
* TABLE II. Group E inspection (all quality levels) for qualification or re-qualification only.
Inspection
Qualification and
large lot quality
Method
Conditions
conformance
inspection
Subgroup 1
45 devices
c=0
Temperature cycling
1051
500 cycles
Hermetic seal
1071
Fine leak
Gross leak
Electrical measurements
Table I, subgroup 2 herein.
Subgroup 2
45 devices
c=0
Test temperature = +125°C; VCB = 30 V dc;
Blocking life
1048
t = 1000 hours.
Electrical measurements
Table I, subgroup 2 herein.
Subgroup 4
Thermal impedance curves
See table E-IX of MIL-PRF-19500, group E, subgroup
4.
Subgroup 5
Not applicable
Subgroup 8
45 devices
c=0
Reverse stability
1033
Condition A
11



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