MIL-PRF-19500/616G
4.4.1 Group A inspection. Group A inspection shall be conducted in accordance with appendix E, table E-V of
MIL-PRF-19500, and table I herein.
4.4.2 Group B inspection. Group B inspection shall be conducted in accordance with the conditions of appendix E,
tables E-VIa (JANS) and E-VIb (JANTX and JANTXV) of MIL-PRF-19500. Electrical measurements (end-points)
shall be in accordance with table I, subgroup 2 herein. See table III herein for delta limits when applicable.
* 4.4.2.1 Group B inspection, appendix E, table E-VIa (JANS of MIL-PRF-19500).
Subgroup
Method
Condition
B4
1037
TA = room ambient as defined in the general requirements of 4.5 of
MIL-STD-750. IF or IO = 1.25 to 10 A. Minimum for 2,000 cycles.
B5
1027
For irradiated devices, include trr as an end-point measurement.
* 4.4.2.2 Group B inspection, appendix E, table E-VIb (JANTX and JANTXV of MIL-PRF-19500).
Method
Condition
Subgroup
B3
1037
TA = room ambient as defined in the general requirements of 4.5 of
MIL-STD-750. IF or IO = 1.25 to 10 A. Minimum for 2,000 cycles. For irradiated
devices, include trr as an end-point measurement.
4.4.3 Group C inspection. Group C inspection shall be conducted in accordance with the conditions specified for
subgroup testing in appendix E, table E-VII of MIL-PRF-19500. Electrical measurements (end-points) shall be in
accordance with table I, subgroup 2 herein. See table III herein for delta limits when applicable.
* 4.4.3.1 Group C inspection, appendix E, table E-VII of MIL-PRF-19500.
Method
Condition
Subgroup
C2
2036
Test condition A, weight = 10 pounds, t = 15 seconds.
RJC = 2.3C/W.
C5
4081
TA = room ambient as defined in the general requirements of 4.5 of
C6
1037
MIL-STD-750. IF or IO = 1.25 to 10 A for 6,000 cycles. For irradiated devices,
include trr as an end-point measurement.
4.4.4 Group E inspection. Group E inspection shall be conducted in accordance with the conditions specified for
subgroup testing in appendix E, table E-IX of MIL-PRF-19500 and table II herein. Electrical measurements (end-
points) shall be in accordance with table I, subgroup 2 herein. See table III herein for delta limits when applicable.
4.5 Methods of inspection. Methods of inspection shall be as specified in the appropriate tables as follows.
4.5.1 Pulse measurements. Conditions for pulse measurement shall be as specified in section 4 of MIL-STD-750.
4.5.2 Burn-in and steady-state operation life tests. These tests shall be conducted with a half-sine waveform of the
specified peak voltage impressed across the diode in the reverse direction followed by a half-sine waveform of the
specified average rectifier current. The forward conduction angle of the rectified current shall not be greater than 180
degrees nor less than 150 degrees.
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