MIL-PRF-19500/620J
4.2 Qualification inspection. Qualification inspection shall be in accordance with MIL-PRF-19500 and as specified
herein.
4.2.1 Group E qualification. Group E inspection shall be performed for qualification or requalification only. In case
qualification was awarded to a prior revision of the specification sheet that did not require the performance of table II
tests, the tests specified in table II herein that were not performed in the prior revision shall be performed on the first
inspection lot of this revision to maintain qualification.
4.2.2 JANHC and JANKC devices. Qualification for JANHC and JANKC devices shall be in accordance with
MIL-PRF-19500. This testing may be performed in a TO-5 package in lieu of the axial leaded package.
4.3 Screening (JANS, JANTXV, and JANTX levels only). Screening shall be in accordance with table E-IV of
MIL-PRF-19500, and as specified herein. The following measurements shall be made in accordance with table I
herein. Devices that exceed the limits of table I herein shall not be acceptable.
Screen
Measurement
(see table E-IV of
JANS level
JANTXV and JANTX level
MIL-PRF-19500)
2
Not required
Not required
3b
Not applicable
Not applicable
(1) 3c
Required (see 4.3.3)
Required (see 4.3.3)
4, 5, and 6
Not applicable
Not applicable
8
Required
Not required
Required
9
Not applicable
IR1 and VFM2
Required
Required
1N5822, TA = +90°C; VRWM = 40 V(pk);
1N5822, TA = +90°C; VRWM = 40 V(pk);
(2) 10
1N6864, TA = +80°C; VRWM = 80 V(pk);
1N6864, TA = +80°C; VRWM = 80 V(pk);
VRWM = half sine wave, f = 60Hz
VRWM = half sine wave, f = 60Hz
Required
ĆIR1 ≤ 100 percent of initial reading or
Required
11
IR1 and VFM2
0.05 mA whichever is greater;
ĆVFM2 ≤ ±50 mV dc.
12
See 4.3.2
t = 96 hours. See 4.3.2
Required
Required
Subgroup 2 of table I herein;
Subgroup 2 of table I herein;
ĆIR1 ≤ 100 percent of initial reading or
ĆIR1 ≤ 100 percent of initial reading or
13
0.05 mA whichever is greater;
0.05 mA whichever is greater;
ĆVFM2 ≤ ±50 mV dc
ĆVFM2 ≤ ±50 mV dc
* (1) Thermal impedance shall be performed anytime after temperature cycling, screen 3a, JANTX and JANTXV
levels do not need to be repeated in screening requirements.
(2) Junction temperature (TJ) is not to exceed 115°C at VRWM. TJ is affected by the device mounting thermal
resistance when parasitic power is generated by the temperature dependent leakage current. Until this leakage
becomes significant near thermal runaway, TJ remains approximately equal to TA or TJ for IO = 0.
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