MIL-PRF-19500/620J
4.4.2.2 Group B inspection, table E-VIb (JAN, JANTX, and JANTXV) of MIL-PRF-19500.
Subgroup
Method
Condition
-55°C to 100°C, 10 cycles, n = 22, c = 0.
B2
1056
-55°C to 150°C, 25 cycles, n = 22, c = 0.
B2
1051
IFSM = 80 A (pk), condition A 2, IO = 3 A dc; TA = room ambient as defined in 4.5
B2
4066
of MIL-STD-750; five surges of 8.3 ms each at 1 minute intervals.
IF = 3 A dc minimum, adjust IF or TA to achieve TJ = +125°C.
B3
1027
B4
2075
As applicable.
4.4.3 Group C inspection. Group C inspection shall be conducted in accordance with the conditions specified for
subgroup testing in table E-VII of MIL-PRF-19500. Electrical measurements (end-points) shall be in accordance with
table I, subgroup 2 herein.
4.4.3.1 Group C inspection, table E-VII of MIL-PRF-19500.
Subgroup
Method
Condition
*
C2
2036
Axial devices: Tension: Test condition A; weight = 20 pounds; t = 15 seconds.
Lead fatigue: Test condition E; weight 1 pound.
*
C2
2038
US devices: Weight = 20 pounds; t = 15 seconds.
C5
4081
See 4.4.5 herein.
IF = 3 A dc minimum, adjust IF or TA to achieve TJ = +125°C minimum.
C6
1027
4.4.4 Group E inspection. Group E inspection shall be conducted in accordance with the tests and conditions
specified for subgroup testing in table E-IX of MIL-PRF-19500, and table II herein. Electrical measurements (end-
points) shall be in accordance with table I, subgroup 2 herein.
4.4.5 Thermal resistance. Thermal resistance measurement shall be in accordance with method 3101 or 4081 of
MIL-STD-750. Forced moving air or draft shall not be permitted across the device during test. The maximum limit for
RθJL under these test conditions shall be RθJL (max) = 30°C/W, RθJEC (max) = 10°C/W. The following conditions
shall apply when using method 3101:
a. IM:
1mA to 10mA.
b. IH:
3A minimum.
c. tH:
25 seconds minimum.
d. tMD: 70 µs maximum.
4.5 Methods of inspection. Methods of inspection shall be as specified in the appropriate tables and as follows.
4.5.1 Pulse measurements. Conditions for pulse measurement shall be as specified in section 4 of MIL-STD-750.
4.5.2 Steady-state operation life. This test shall be conducted with a half-sine wave of the specified peak voltage
impressed across the diode in the reverse direction followed by a half-sine waveform of the specified average
rectified current. The forward conduction angle of the rectified current shall not be greater than 180 degrees nor less
than 150 degrees.
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