MIL-PRF-19500/118L
4.2.1 Group E qualification. Group E inspection shall be performed for qualification and requalification only. In
case qualification was awarded to a prior revision of the specification sheet that did not request the performance of
table II tests, the tests specified in table II herein that were not performed in the prior revision shall be performed on
the first inspection lot of this revision to maintain qualification.
4.3 Screening (JANTXV, JANTX, and JAN levels). Screening shall be in accordance with table E-IV of
MIL-PRF-19500 and as specified herein. Specified electrical measurements shall be made in accordance with table I
herein. Devices that exceed the limits of table I herein shall not be acceptable.
Screening
(see table E-IV of
JANTXV and JANTX level
MIL-PRF-19500)
(1) 3c
Thermal impedance (see 4.3.2)
9
Not required
Method 1038 of MIL-STD-750, condition A
10
IR1 and VF1
(2) 11
12
See 4.3.1
Subgroup 2 of table I herein; IR1 100 percent
(3) (4) 13
of initial value or 15 nA dc, whichever is greater;
VF1 25 mV dc
(1) Thermal impedance shall be performed any time after sealing provided temperature cycling is performed in
accordance with MIL-PRF-19500, screen 3 prior to this thermal test.
(2) Test within 24 hours after removal from test.
(3) When thermal impedance is performed prior to screen 13, it is not required to be repeated in screen 13.
(4) PDA 5 percent.
4.3.1 Free air power burn-in conditions. Power burn-in conditions are as follows (see 4.5.1): Method 1038 of
MIL-STD-750, condition B. VR = rated VRWM; f = 50 - 60 Hz; IO(min) = 200 mA dc, IF = 175 mA dc. The
maximum current density of small die shall be submitted to the qualifying activity for approval. With approval of the
qualifying activity and preparing activity, alternate burn-in criteria (hours, bias conditions, mounting conditions) may
be used. A justification demonstrating equivalence is required. In addition, the manufacturing site's burn-in data
and performance history will be essential criteria for burn-in modification approval.
4.3.1.1 JAN testing. JAN level product will have temperature cycling and thermal impedance testing performed in
accordance with MIL-PRF-19500, JANTX level screening level requirements. Electrical testing shall be in
accordance with table I, subgroup 2 herein.
4.3.2 Thermal impedance. The thermal impedance measurements shall be performed in accordance with method
3101 or 4081 of MIL-STD-750 using the guidelines in that method for determining IM, IH, tH, tSW. Measurement
delay time (tMD) = 70 s max. The thermal impedance limit used in screen 3c and table I, subgroup 2 shall be set
statistically by the supplier.
4.4 Conformance inspection. Conformance inspection shall be in accordance with MIL-PRF-19500.
4.4.1 Group A inspection. Group A inspection shall be conducted in accordance with table E-V of MIL-PRF-19500,
table I herein, and as specified herein. Electrical measurements (end-points) shall be in accordance with table I,
subgroup 2 herein.
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