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MIL-PRF-19500-124 Semiconductor Device, Diode, Silicon, Voltage Regulator Types 1N2970B Through 1N2977B, 1N2979B, 1N2980B, 1N2982B, 1N2984B Through 1N2986B, 1N2988B Through 1N2993B, 1N2995B, 1N2997B, 1N2999B Through 1N3005B, 1N3007B, 1N3008B, 1N3009B, 1N3011B, 1N3012B, 1N3014B, 1N3015B, Plus Rb Types, 1N3993A Through 1N3998A, And Ra Types, Jan, Jantx, Jantxv, And JansThis specification covers the performance requirements for 10 watt, silicon voltage regulator diodes: A and B type \(standard polarity\); RA and RB type \(reverse polarity\). Four levels of product assurance are provided for each device type as specified in MIL–PRF–19500.

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MIL­PRF­19500/124L
4.5.6 DC intermittent operation life. A cycle shall consist of an "on" period, when forward current is applied
suddenly, not gradually, to the device for the time necessary to achieve an increase (delta) case temperature of
+85°C +15°C, ­0°C followed by an "off" period, when the current is suddenly removed for cooling the case through a
similar delta temperature. Auxiliary (forced) cooling is permitted during the "off" period only. Forward current and
"on" time, within specific limits, and "off" time may be adjusted to achieve the delta case temperature. Heat sinks
shall only be used if, and to the degree necessary, to maintain test samples within the desired delta temperature
tolerance. The heating time shall be such that 30 s ≤ theating ≤ 180 s. The forward current may be steady-state dc,
full-wave rectified dc, or the equivalent half-sine wave dc, of the specified value. Alternately, IZ may be used to
achieve heating. The test duration shall be the specified number of cycles. Within the time interval of 50 cycles
before and 500 cycles after the termination of the test, the sample units shall be removed from the specified test
conditions and allowed to reach room ambient conditions. Specified end-point measurements for qualification and
quality conformance inspections shall be completed within 96 hours after removal of sample units from the specified
test conditions. Additional readings may be taken at the discretion of the manufacturer.
TABLE I. Group A inspection.
Limits 2/
Inspection 1/
Symbol
Unit
Method
Conditions
Min
Max
Subgroup 1
Visual and mechanical
2071
examination
Subgroup 2
Forward voltage
4011
IF = 2 A dc
VF
1.5
V dc
µA dc
Reverse current
4016
VR = column 11 of table III
IR1
Column 12
herein, DC method
Regulator voltage
4022
IZ = column 5 of table III herein
VZ
Column 3
Column 4
V dc
(see 4.5.3)
Subgroup 3
TA = 150°C
High temperature
operation
µA dc
Reverse current
4016
VR = column 11 of table III,
IR2
500
DC method
Subgroup 4
IZ = column 5 of table III,
Small-signal reverse
4051
ZZ
Column 6
ohms
Isig = 10 of percent IZT
breakdown impedance
IZK = 1 mA dc,
ohms
Knee impedance
ZZK
Column 7
Isig = 10 percent of IZK
See footnotes at end of table.
7



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