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MIL-PRF-19500-124 Semiconductor Device, Diode, Silicon, Voltage Regulator Types 1N2970B Through 1N2977B, 1N2979B, 1N2980B, 1N2982B, 1N2984B Through 1N2986B, 1N2988B Through 1N2993B, 1N2995B, 1N2997B, 1N2999B Through 1N3005B, 1N3007B, 1N3008B, 1N3009B, 1N3011B, 1N3012B, 1N3014B, 1N3015B, Plus Rb Types, 1N3993A Through 1N3998A, And Ra Types, Jan, Jantx, Jantxv, And JansThis specification covers the performance requirements for 10 watt, silicon voltage regulator diodes: A and B type \(standard polarity\); RA and RB type \(reverse polarity\). Four levels of product assurance are provided for each device type as specified in MIL–PRF–19500.

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MIL­PRF­19500/124L
TABLE II. Groups B and C electrical and delta measurements. 1/ 2/ 3/
Limits 4/
Step
Inspection
Symbol
Unit
Method
Conditions
Min
Max
DC method;
µA dc
1
Reverse current
4016
IR1
Column 12
VR = column 11 of table III
herein
DC method;
µA dc
2
Reverse current
4016
IR3
Column 13
VR = column 11 of table III
herein
3
Breakdown voltage
4022
IZ = column 5 of table III
VZ
Column 3
Column 4
V dc
herein
Small signal
ZZ
Column 6
ohms
4
IZ = column 5 of table III,
4051
breakdown
herein
impedance
Isig = 10 percent of IZ
IZK = 1 mA dc
ZZK
Column 7
ohms
5
Knee impedance
4051
Isig = 10 percent of IZK
ĆVF 5/
6
Forward voltage
4011
IF = 2.0 A dc
1.5
V dc
1/
The electrical measurements for table E­VIa (JANS) of MIL­PRF­19500 shall be as follows:
a.  In addition to the measurements specified for subgroup 3, the measurements of steps 1, 3, 4, 5, and 6 of
this table shall also be taken.
b.  In addition to the measurements specified for subgroup 4, the measurements of steps 1, 3, 4, 5, and 6 of
this table shall also be taken.
c.  In addition to the measurements specified for subgroup 5, the measurements of steps 2, 3, 4, 5, and 6 of
this table shall also be taken.
2/
The electrical measurements for table E­VIb (JANTX and JANTXV) of MIL­PRF­19500 shall be as follows:
a.  In addition to the measurements specified for subgroup 2, the measurements of steps 1, 3, and 4 of this
table shall also be taken.
b.  In addition to the measurements specified for subgroup 3, the measurements of steps 2, 3, and 4 of this
table shall also be taken.
c.  In addition to the measurements specified for subgroup 6, the measurements of steps 2, 3, and 4 of this
table shall also be taken.
The electrical measurements for table E­VII of MIL­PRF­19500 shall be as follows:
3/
a.  In addition to the measurements specified for subgroup 2, the measurements of steps 1, 3, 4, 5, and 6
(JANS), or steps 1, 3, and 4 (JAN, JANTX, and JANTXV) of this table shall also be taken.
b.  In addition to the measurements specified for subgroup 3, the measurements of steps 1, 3, 4, 5, and 6
(JANS), or steps 1, 3, and 4 (JAN, JANTX, and JANTXV) of this table shall also be taken.
c.  In addition to the measurements specified for subgroup 6, the measurements of steps 2, 3, 4, 5, and 6
(JANS), or steps 2, 3, and 4 (JAN, JANTX, and JANTXV) of this table shall also be taken.
4/
Column references are to table III herein.
5/
Devices which exceed the group A limits for this test shall not be accepted.
9



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