MIL-PRF-19500/253L
TABLE I. Group A inspection.
Inspection 1/
MIL-STD-750
Limit
Unit
Symbol
Method
Conditions
Min
Max
Subgroup 1 2/
Visual and mechanical
2071
n = 45 devices, c = 0
examination 3/
Solderability 3/ 4/
2026
n = 15 leads, c = 0
Resistance to solvents
1022
n = 15 devices, c = 0
3/ 4/ 5/
Temperature cycling 3/ 4/
1051
Test condition C, 25 cycles.
n = 22 devices, c = 0
Hermetic seal 4/ 6/
1071
n = 22 devices, c = 0
Fine leak
Gross leak
Electrical measurements
Table I, subgroup 2
Bond strength 3/ 4/
2037
Precondition
TA = +250°C at t = 24 hrs or
TA = 300°C at t = 2 hrs
n = 11 wires, c = 0
Decap internal visual
2075
n = 4 device, c = 0
(design verification) 4/
Subgroup 2
°C/W
Thermal impedance
3131
See 4.3.3
ZθJX
µA dc
Collector to base cutoff
3036
10
Bias condition D, VCB = 60 V dc
ICBO1
current
µA dc
Emitter to base cutoff
3061
10
Bias condition D, VEB = 6 V dc
IEBO1
current
45
V dc
Breakdown voltage,
3011
Bias condition D; IC = 10 mA dc;
V(BR)CEO
collector to emitter
pulsed (see 4.5.1)
Collector to emitter
3041
2.0
nA dc
Bias condition C; VCE = 45 V dc
ICES1
cutoff current
Collector to emitter
3041
2.0
nA dc
Bias condition C; VCE = 5 V dc
ICEO
cutoff current
Emitter to base cutoff
3061
5
nA dc
Bias condition D; VEB = 5 V dc
IEBO2
current
See footnotes at end of table.
13
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