MIL-PRF-19500/253L
TABLE I. Group A inspection - Continued.
Inspection 1/
MIL-STD-750
Limit
Unit
Symbol
Method
Conditions
Min
Max
Subgroup 4 - continued.
VCE = 5 V dc; IC = 10 µA dc;
Noise figure
3246
NF
Rg = 10 kΩ
Test 1
5
dB
f = 100Hz
Test 2
3
dB
f = 1 kHz
Test 3
3
dB
f = 10 kHz
Small-signal open-circuit
3216
0
1.0
mhos
VCB = 5 V dc; IE = 1.0 mA dc;
hob
output admittance
f = 1 kHz
-4
Small-signal open-circuit
3211
VCB = 5 V dc; IE = 1.0 mA dc;
6 x 10
hrb
reverse voltage transfer ratio
f = 1 kHz
Ω
Small-signal short-circuit input
3201
25
32
VCB = 5 V dc; IE = 1.0 mA dc;
hib
impedance
f = 1 kHz
Subgroups 5 and 6
Not applicable
1/ For sampling plan, unless otherwise specified, see MIL-PRF-19500.
2/ For resubmission of failed subgroup 1, of table I, double the sample size of the failed test or sequence of tests.
A failure in table I, subgroup 1 shall not require retest of the entire subgroup. Only the failed test shall be rerun
upon submission.
3/ Separate samples may be used.
4/ Not required for JANS devices.
5/ Not required for laser marked devices.
6/ This hermetic seal test is an end-point to temp-cycling in addition to electrical measurements.
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