MIL-PRF-19500-253 Semiconductor Device, Transistor, Npn, Silicon, Low-Power, Types 2N930 And 2N930Ub, Jan, Jantx, Jantxv, Jans, Janhc, Jankc Jansm, Jansd, Jansp, Jansl, Jansr, Jansf, Jansg, Jansh, Janhc, Janhcm, Janhcd, Janhcp, Janhcl, Janhcr, Janhcf, Janhcg, Janhch, Jankc, Jankcm, Jankcd, Jankcp, Jankcl, Jankcr, Jankcf, Jankcg, And JankchThis specification covers the performance requirements for an NPN, silicon, low-power transistors. Four levels of product assurance are provided for each device type as specified in MIL-PRF-19500, and two levels of product assurance are provided for each unencapsulated device. RHA level designators "M", "D", "P", "L" "R", "F", "G", and "H" are appended to the device prefix to identify devices which have passed RHA requirements.

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MIL-PRF-19500/253L

* TABLE IV. Groups B, C, and E delta measurements.

Step

Inspection

MIL-STD-750

Symbol

Limit

Unit

Method

Conditions

Collector-base cutoff

3036

Bias condition D,

100 percent of initial

ĆICB02

current

value or 5 nA dc,

VCB = 45 V dc

whichever is greater.

�25 percent change

ĆhFE2

Forward current transfer

3076

VCE = 5 V dc;

IC = 500 �A dc;

ratio

from initial reading.

pulsed see 4.5.1.

1/ Devices which exceed the table I limits for this test shall not be accepted.