MIL-PRF-19500/355R
* TABLE I. Group A inspection.
Inspection 1/
MIL-STD-750
Limit
Unit
Symbol
Method
Conditions
Min
Max
Subgroup 1 2/
Visual and mechanical
2071
examination 3/
Solderability 3/ 4/
2026
n = 15 leads, c = 0
Resistance to solvents
1022
n = 15 devices, c = 0
3/ 4/ 5/
Temp cycling 3/ 4/
1051
Test condition C, 25 cycles.
n = 22 devices, c = 0
Hermetic seal 4/ 6/
1071
n = 22 devices, c = 0
Fine leak
Gross leak
Electrical measurements 4/
Table I, subgroup 2
Bond strength 3/ 4/
2037
Precondition
TA = +250°C at t = 24 hours or
TA = +300°C at t = 2 hours
n = 11 wires, c = 0
Decap internal visual (design
2075
N = 4 devices, c = 0
verification) 4/
Subgroup 2
°C/W
Thermal response
3131
See 4.3.2.
ZθJX
µA dc
Collector to base cutoff current
3036
10
Bias condition D, VCB = 70 V dc
ICBO1
µA dc
Emitter to base cutoff current
3061
10
Bias condition D, VEB = 6 V dc
IEBO1
Breakdown voltage, collector to
3011
60
V dc
Bias condition D; IC = 10 mA dc;
V(BR)CEO
emitter
pulsed (see 4.5.1)
Collector to base cutoff current
3036
2
nA dc
Bias condition D; VCB = 45 V dc
ICBO2
Collector to emitter cutoff
3041
2
nA dc
Bias condition D; VCE = 5 V dc
ICEO1
current
Emitter to base cutoff current
3061
2
nA dc
Bias condition D; VEB = 5 V dc
IEBO2
VCE = 5 V dc; IC = 10 µA dc
Forward-current transfer ratio
3076
hFE1
2N2919, 2N2919L, 2N2919U
60
240
2N2920, 2N2920L, 2N2920U
175
600
VCE = 5 V dc; IC = 100 µA dc
Forward-current transfer ratio
3076
hFE2
2N2919, 2N2919L, 2N2919U
100
325
2N2920, 2N2920L, 2N2920U
235
800
See footnotes at end of table.
13
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