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MIL-PRF-19500-355 Semiconductor Device, Unitized Dual Transistor, Npn, Silicon, Types 2N2919, 2N2920, 2N2919L, 2N2920L, 2N2919U, And 2N2920U, Jan, Jantx, Jantxv, Jans, Jansm, Jansd, Jansp, Jansl, Jansr, Jansf, Jansg, Jansh, Janhc, Janhcm, Janhcd, Janhcp, Janhcl, Janhcr, Janhcf, Janhcg, Janhch, Jankc, Jankcm, Jankcd, Jankcp, Jankcl, Jankcr, Jankcf, Jankcg, And JankchThis specification covers the performance requirements for two electrically isolated, matched NPN silicon transistors as one dual unit. Four levels of product assurance are provided for each device type as specified in MIL-PRF-19500. Two levels of product assurance are provided for each unencapsulated device type die. RHA level designators "M", "D", "P", "L", "R", "F", "G" and "H" are appended to the device prefix to identify devices, which have passed RHA requirements.

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MIL-PRF-19500/355R
TABLE I. Group A inspection - Continued.
*
Inspection 1/
MIL-STD-750
Limit
Unit
Symbol
Method
Conditions
Min
Max
Subgroup 4
Small-signal short-circuit input
3201
VCE = 5 V dc; IC = 1 mA dc;
kΩ
impedance
3
30
hie
f = 1 kHz
Small-signal open-circuit
3211
VCE = 5 V dc; IC = 1 mA dc;
1 x 10-3
reverse voltage transfer ratio
hre
f = 1 kHz
Small-signal open-circuit
3216
VCE = 5 V dc; IC = 1 mA dc;
µmhos
output admittance
60
hoe
f = 1 kHz
Small-signal short-circuit
3306
VCE = 5 V dc; IC = 0.5 mA dc;
forward current transfer ratio
3
20
| hfe |
f = 20 MHz
(magnitude hfe)
Open circuit output
3236
VCB = 5 V dc; IE = 0
capacitance
5
pF
100 kHz ≤ f ≤ 1 MHz
Cobo
VCE = 5 V dc, IC = 10 µA dc
Noise figure
3246
Rg = 10 kΩ, (see 4.5.7)
Test 1
f = 100 Hz
F1
5
dB
Test 2
f = 1 kHz
F2
3
dB
Test 3
f = 10 kHz
F3
3
dB
Subgroup 5
3041
20
nA dc
Bias condition D; VCE = 40 V dc
ICES
Collector to emitter cutoff
current
Subgroups 6 and 7
Not required
1/ For sampling plan see MIL-PRF-19500.
2/ For resubmission of failed test in subgroup 1 of table I, double the sample size of the failed test or sequence of
tests. A failure in table I, subgroup 1 shall not require retest of the entire subgroup. Only the failed test shall
be rerun upon submission.
3/ Separate samples may be used.
4/ Not required for JANS devices.
5/ Not required for laser marked devices.
6/ When using table I, subgroup 2 as electrical end-points, this test is only required for JANS end-points.
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