MIL-PRF-19500/421G
4.4 Conformance inspection. Conformance inspection shall be in accordance with MIL-PRF-19500, and as
specified herein. If alternate screening is being performed in accordance with MIL-PRF-19500, a sample of screened
devices shall be submitted to and pass the requirements of group A1 and A2 inspection only (table VIb, group B,
subgroup 1 is not required to be performed again if group B has already been satisfied in accordance with 4.4.2).
4.4.1 Group A inspection. Group A inspection shall be conducted in accordance with MIL-PRF-19500, and
table I herein.
4.4.2 Group B inspection. Group B inspection shall be conducted in accordance with the conditions specified for
subgroup testing in 4.4.2.1 for JAN, JANTX, and JANTXV group B testing. Electrical measurements (end-points) and
for JAN, JANTX, and JANTXV shall be after each step in 4.4.2.1 and shall be in accordance with table I, subgroup 2
herein.
* 4.4.2.1 Group B inspection, (JAN, JANTX, and JANTXV). Separate samples may be used for each step. In the
event of a lot failure, the resubmission requirements of MIL-PRF-19500 shall apply. In addition, all catastrophic
failures during conformance inspection shall be analyzed to the extent possible to identify root cause and corrective
action. Whenever a failure is identified as wafer lot and /or wafer processing related, the entire wafer lot and related
devices assembled from the wafer lot shall be rejected unless an appropriate determined corrective action to
eliminate the failure mode has been implemented and the devices from the wafer lot are screened to eliminate the
failure mode.
Step
Method
Condition
1
1039
Steady-state life: Test condition B, 1,000 hours minimum, VCB = 10 dc, power shall be
applied to achieve TJ = +150°C minimum using a minimum of PD = 75 percent of maximum
rated PT as defined in 1.4. n = 45 devices, c = 0.
2
1039
HTRB: Test condition A, 48 hours minimum. n = 45 devices, c = 0.
High-temperature life (non-operating), t = 340 hours, TA = +200°C. n = 22, c = 0.
3
1032
4.4.2.2 Group B sample selection. Samples selected for group B inspection shall meet all of the following
requirements:
a.
For JAN, JANTX, and JANTXV samples shall be selected randomly from a minimum of three wafers
(or from each wafer in the lot) from each wafer lot. See MIL-PRF-19500.
b.
Must be chosen from an inspection lot that has been submitted to and passed table I, subgroup 2,
conformance inspection. When the final lead finish is solder or any plating prone to oxidation at high
temperature, the samples for life test (group B for JAN, JANTX, and JANTXV) may be pulled prior to
the application of final lead finish.
8
For Parts Inquires call Parts Hangar, Inc (727) 493-0744
© Copyright 2015 Integrated Publishing, Inc.
A Service Disabled Veteran Owned Small Business