MIL-PRF-19500/421G
4.4.3 Group C inspection, Group C inspection shall be conducted in accordance with the test and conditions
specified for subgroup testing in table VII of MIL-PRF-19500, and 4.4.3.1 (JAN, JANTX, and JANTXV) herein for
group C testing. Electrical measurements (end-points) requirements shall be in accordance with table I, subgroup 2
herein.
*
4.4.3.1 Group C inspection, appendix E, table VII of MIL-PRF-19500.
Subgroup
Method
Conditions
C2
2036
Test condition E, not applicable to U.
C5
3131
RθJA and RθJC, see 1.4.
C6
1026
Not applicable.
* 4.4.3.2 Group C sample selection. Samples for subgroups in group C shall be chosen at random from any
inspection lot containing the intended package type and lead finish procured to the same specification which is
submitted to and passes group A tests for conformance inspection. Testing of a subgroup using a single device type
enclosed in the intended package type shall be considered as complying with the requirements for that subgroup.
* 4.4.4 Group E inspection. Group E inspection shall be conducted in accordance with the conditions specified for
subgroup testing in appendix E, table IX of MIL-PRF-19500 and as specified in table II herein. Electrical
measurements (end-points) shall be in accordance with table I, subgroup 2 herein.
4.5 Method of inspection. Methods of inspection shall be as specified in the appropriate tables and as follows.
4.5.1 Pulse measurements. Conditions for pulse measurements shall be as specified in section 4 of MIL-STD-750.
4.5.2 Testing of units. All specified electrical tests, including end-point tests, shall be performed equally on both
sections of the transistor types covered herein, except where the electrical characteristic being evaluated applies to
the transistor as a device entity.
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