MIL-PRF-19500/453F
TABLE I. Group A inspection.
Inspection 1/
MIL-STD-750
Symbol
Limits
Unit
Method
Conditions
Min
Max
Subgroup 1 2/
n = 45 devices, c = 0
2071
Visual and mechanical 3/
examination
Solderability 3/ 4/
2026
n = 15 leads, c = 0
Resistance to 3/ 4/ 5/
1022
n = 15 devices, c = 0
solvent
1051
Test condition C, 25 cycles.
Temp cycling 3/ 4/
n = 22 devices, c = 0
Hermetic seal 4/
1071
n = 22 devices, c = 0
Fine leak
Gross leak
Electrical measurements 4/
Table I, subgroup 2
Precondition TA = +250°C at t = 24
Bond strength 3/ 4/
2037
hrs or TA = +300°C at t = 2 hrs,
n = 11 wires, c = 0
Subgroup 2
Thermal impedance 6/
3131
See 4.3.2
°C/W
ZθJX
Bias condition D; IC = 100 µA dc
Breakdown voltage,
3001
40
V dc
V(BR)CBO
collector to base
Breakdown voltage,
3011
20
V dc
Bias condition D; IC = 5 mA dc
V(BR)CEO
collector to emitter
Bias condition D; IC = 100 µA dc
Breakdown voltage,
3026
3.0
V dc
V(BR)EBO
emitter to base
Breakdown voltage,
3011
40
V dc
Bias condition D; IC = 5 mA dc; R2 =
V(BR)CER
collector to emitter
10 Ω
µA dc
Collector to emitter
3041
20
Bias condition D; VCE = 15 V dc
ICE01
cutoff current
Forward-current
3076
40
150
VCE = 15 V dc; IC = 50 mA dc;
hFE1
transfer ratio
pulsed (see 4.5.1)
Collector to emitter
3071
0.5
V dc
IC = 100 mA dc; IB = 10 mA dc;
VCE(sat)1
saturated voltage
pulsed (see 4.5.1)
Subgroup 3
TC = +175°C
High temperature
operation:
Collector to emitter
3041
5.0
mA dc
Bias condition D; VCE = 15 V dc
ICE02
cutoff current
See footnotes at end of table.
10
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