MIL-PRF-19500/453F
4.4.1 Group A inspection. Group A inspection shall be conducted in accordance with MIL-PRF-19500 and table I
herein.
4.4.2 Group B inspection. Group B inspection shall be conducted in accordance with the tests and conditions
specified for subgroup testing in table E-VIa (JANS) and 4.4.2.1 herein. See 4.4.2.2 for JAN, JANTX, and JANTXV
group B testing. Electrical measurements (end-points) shall be in accordance with table I, subgroup 2 herein.
4.4.2.1 Group B inspection table E-VIa (JANS) of MIL-PRF-19500.
Method
Conditions
Subgroup
VCB = 10 - 30 V dc, adjust power or current to achieve a ĆTJ = +100°C.
B4
1037
VCB = 10 V dc; TA = +125°C ±25°C for 96 hours with PT adjusted according to the
B5
1027
chosen TA to give TJ = +275°C minimum. Optionally, the test may be performed for a
minimum of 216 hours with PT adjusted to achieve a TJ = +225°C; sample size = 45,
c = 0. In this case, the ambient temperature shall be adjusted such that a minimum
75 percent of maximum rated PT (see1.3) is applied to the device under test. (NOTE:
If a failure occurs, resubmission shall be at the test conditions of the original sample.)
4.4.2.2 Group B inspection, table E-VIb (JAN, JANTX and JANTXV). Separate samples may be used for each
step. In the event of a group B failure, the manufacturer may pull a new sample at double size from either the failed
assembly lot or from another assembly lot from the same wafer lot. If the new "assembly lot" option is exercised, the
failed assembly lot shall be scrapped.
Step
Method
Conditions
1
1026
Steady-state life: 340 hours, VCB = 10 - 30 V dc; power shall be applied to
achieve TJ = +150°C minimum and a power dissipation of PD ≥ 75 percent of
max rated PT as defined in 1.3 herein shall be used. n = 45 devices, c = 0. For
small lots, n = 12 devices, c = 0. The sample size may be increased and the
test time decreased so long as the devices are stressed for a total of 45,000
device hours minimum, and the actual time of test is at least 340 hours.
2
1048
Blocking life, TA = +150°C, VCB = 80 percent of rated voltage, 48 hours minimum.
n = 45 devices, c = 0.
High-temperature life (non-operating), t = 340 hours, TA = +200°C. n = 22,
3
1032
c = 0.
4.4.2.3 Group B sample selection. Samples selected from group B inspection shall meet all of the following
requirements:
a.
For JAN, JANTX and JANTXV samples shall be selected randomly from a minimum of three wafers (or
from each wafer in the lot) from each wafer lot. For JANS samples shall be selected from each inspection
lot. See MIL-PRF-19500.
b.
Shall be chosen from an inspection lot that has been submitted to and passed group A, subgroup 2,
conformance inspection. When the final lead finish is solder or any plating prone to oxidation at high
temperature, the samples for life test (subgroups B4 and B5 for JANS, and group B for JAN, JANTX and
JANTXV) may be pulled prior to the application of final lead finish.
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