MIL-PRF-19500/453F
TABLE I. Group A inspection - Continued.
Inspection 1/
MIL-STD-750
Symbol
Limits
Unit
Method
Conditions
Min
Max
Subgroup 3 - Continued
TA = -55°C
Low temperature
operation
Forward-current
3076
15
VCE = 5 V dc; IC = 50 mA dc;
hFE2
transfer ratio
pulsed (see 4.5.1)
Subgroup 4
VCB = 28 V dc; IE = 0; 100 kHz ≤ f ≤ 1 MHz
Open circuit output
3236
3.5
pF
Cobo
capacitance
hfe
Magnitude of common-
3306
VCE = 15 V dc; f = 200 MHz
emitter small-signal
short-circuit
forward-current
transfer ratio
5.0
10
IC = 25 mA dc;
6.0
11.0
IC = 50 mA dc;
5.0
10.5
IC = 100 mA dc
Power gain
11
dB
VCC = 15 V dc; IC = 50 mA dc;
GPE
(narrow band) current
f = 200 MHz; pin = -10 dB; (see figure 4)
cm
-57
dB
Cross modulation
VCC = 15 V dc; IC = 50 mA dc;
54 dB output; (see figure 4)
Noise figure
NF
3.5
dB
VCC = 15 V dc; IC = 10 mA dc;
f = 200 MHz; pin = -10 dB; (see figure 4)
Voltage gain (wideband)
G
11
dB
VCC = 15 V dc; IC = 50 mA dc;
f = 50 to 216 MHz; pin = -10 dB
(see figure 5)
Subgroups 5, 6, and 7
Not applicable
1/
For sampling plan, unless otherwise specified see MIL-PRF-19500.
2/
For resubmission of failed subgroup A1, double the sample size of the failed test or sequence of tests. A failure
in table I, subgroup 1 shall not require retest of the entire subgroup. Only the failed test shall be rerun upon
submission.
3/
Separate samples may be used.
4/
Not required for JANS devices.
5/
Not required for laser marked devices.
6/
This test required for the following end-point measurements only:
Group B, step 1 of 4.4.2.2 herein (JAN, JANTX, and JANTXV).
Group B, subgroups 3, 4, and 5 (JANS).
Group C, subgroup 2 and 6.
Group E, subgroup 1 and 2.
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