MIL-PRF-19500-453 Semiconductor Device, Transistor, Npn, Silicon, High-Frequency Type 2N5109 And 2N5109Ub, Jan, Jantx, Jantxv, Jans, Janhc, Jankc Jasm, Jansd, Jansp, Jansl, Jansr, Jansf, Jansg, And JanshThis specification covers the performance requirements for NPN silicon, VHF-UHF amplifier transistors. Four levels of product assurance are provided for each device type as specified in MIL-PRF-19500. Two levels of product assurance are provided for die. Provisions for radiation hardness assurance \(RHA\) to eight radiation levels is provided for JANS and JANKC product assurance levels. RHA level designators "M", "D", "P", "L", "R", "F", "G" and "H" are appended to the device prefix to identify devices, which have passed RHA requirements.

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MIL-PRF-19500/453F

* TABLE III. Group E inspection (all quality levels) � for qualification or re-qualification only.

Inspection

MIL-STD-750

Qualification

Method

Conditions

Subgroup 1

45 devices

c=0

Temperature cycling

1051

Test condition C, 500 cycles.

(air to air)

Hermetic seal

1071

Fine leak

Gross leak

Electrical measurements

See table I, subgroup 2.

Subgroup 2

45 devices

c=0

VCB = 10 V dc, 6000 cycles, adjust power or current

Intermittent life

1037

to achieve a ĆTJ = +100�C.

See table I, subgroup 2.

Electrical measurements

Sample size

Subgroup 4

N/A

Thermal impedance curves

See Mil-PRF-19500.

Subgroup 5

Not applicable

Subgroup 6

3 devices

ESD

1020

Testing not required for class 3 listing. Testing is

required for nonsensitive listing to prove capability.

Subgroup 8

45 devices

c=0

Reverse stability

1033

Condition B.