MIL-PRF-19500-453 Semiconductor Device, Transistor, Npn, Silicon, High-Frequency Type 2N5109 And 2N5109Ub, Jan, Jantx, Jantxv, Jans, Janhc, Jankc Jasm, Jansd, Jansp, Jansl, Jansr, Jansf, Jansg, And JanshThis specification covers the performance requirements for NPN silicon, VHF-UHF amplifier transistors. Four levels of product assurance are provided for each device type as specified in MIL-PRF-19500. Two levels of product assurance are provided for die. Provisions for radiation hardness assurance \(RHA\) to eight radiation levels is provided for JANS and JANKC product assurance levels. RHA level designators "M", "D", "P", "L", "R", "F", "G" and "H" are appended to the device prefix to identify devices, which have passed RHA requirements.

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MIL-PRF-19500/453F

4.4.3 Group C inspection, Group C inspection shall be conducted in accordance with the tests and conditions

specified for subgroup testing in table E-VII of MIL-PRF-19500, and in 4.4.3.1 (JANS) and 4.4.3.2 (JAN, JANTX and

JANTXV) herein for group C testing. Electrical measurements (end-points) shall be in accordance with table I,

subgroup 2 herein.

4.4.3.1 Group C inspection, table E-VII (JANS) of MIL-PRF-19500.

Subgroup

Method

Condition

2036

Test condition E, (not applicable to 2N5109UB).

See 4.3.2, RθJC = 60�C/W.

3131

1,000 hours at VCB = 10 V dc; power shall be applied to achieve TJ = +150�C minimum and

1026

a power dissipation of PD ≥ 75 percent of max rated PT as defined in 1.3 herein shall be

applied. n = 45 devices, c = 0. For small lots, n = 12 devices, c = 0. The sample size may

be increased and the test time decreased so long as the devices are stressed for a total of

45,000 device hours minimum, and the actual time of test is at least 340 hours.

4.4.3.2 Group C inspection, table E-VII (JAN, JANTX, and JANTXV) of MIL-PRF-19500.

Method

Condition

Subgroup

2036

Test condition E (not applicable to 2N5109UB).

See 4.3.2, RθJC = 60�C/W.

3131

Not applicable.

4.4.3.3 Group C sample selection. Samples for subgroups in group C shall be chosen at random from any

inspection lot containing the intended package type and lead finish procured to the same specification which is

submitted to and passes group A tests for conformance inspection. When the final lead finish is solder or any plating

prone to oxidation at high temperature, the samples for C6 life test may be pulled prior to the application of final lead

finish. Testing of a subgroup using a single device type enclosed in the intended package type shall be considered

as complying with the requirements for that subgroup.

* 4.4.4 Group D inspection. Conformance inspection for hardness assured JANS and JANKC types shall include

the group D tests specified in table II herein. These tests shall be performed as required in accordance with

MIL-PRF-19500 and method 1019 of MIL-STD-750, for total ionizing dose or method 1017 of MIL-STD-750 for

neutron fluence as applicable (see 6.2.e herein), except group D, subgroup 2 may be performed separate from other

subgroups. Group D inspection may also be performed ahead of the screening lot using die selected in accordance

with MIL-PRF-19500 and related documents. Alternate package options may also be substituted for the testing

provided there is no adverse effect to the fluence profile.

* 4.4.5 Group E inspection. Group E inspection shall be performed in accordance with table III herein for

qualification or re-qualification only. In case qualification was awarded to a prior revision of the specification that did

not request the performance of table III tests, the tests specified in table III herein must be performed to maintain

qualification.

4.5 Methods of inspection. Methods of inspection shall be as specified in the appropriate tables and as follows.

4.5.1 Pulse measurements. Conditions for pulse measurement shall be as specified in section 4 of MIL-STD-750.