MIL-PRF-19500/456E
* 4.3 Screening (JANS, JANTX, and JANTXV levels). Screening shall be in accordance with table E-IV of
MIL-PRF-19500 and as specified herein. The following measurements shall be made in accordance with table I
herein. Devices that exceed the limits of table I herein shall not be acceptable.
Screen (see table E-IV
Measurement
of MIL-PRF-19500)
JANS level
JANTX and JANTXV levels
(1) 3c
Thermal impedance, method 3131 of
Thermal impedance, method 3131 of
MIL-STD-750 (see 4.3.2)
MIL-STD-750 (see 4.3.2)
ICEX1 and hFE2
Not applicable
9
ICES1 and hFE2
11
ICEX1 and hFE2
ICEX1 = 100 percent or 1 µA
whichever is greater;
hFE2 = 20 percent
12
See 4.3.1
See 4.3.1
13
Subgroups 2 and 3 of table I herein;
Subgroup 2 of table I herein;
ICEX1 = +100 percent of initial value
ICEX1 = +100 percent of initial value
or 1 A, whichever is greater.
or 1 A, whichever is greater.
hFE2 = 15 percent of initial value
hFE2 = 15 percent of initial value
(1) Shall be performed anytime after temperature cycling, screen 3a; and does not need to be repeated in
screening requirements.
4.3.1 Power burn-in conditions. Power burn-in conditions are as follows:
TJ = +187.5C ±12.5C, VCE 10 V dc, TA +35C.
* 4.3.2 Thermal impedance. The thermal impedance measurements shall be performed in accordance with
method 3131 of MIL-STD-750 using the guidelines in that method for determining IM, IH, tH, tSW (VC and VH where
appropriate). See table II, group E, subgroup 4 herein.
4.4 Conformance inspection. Conformance inspection shall be in accordance with MIL-PRF-19500 and as
specified herein
4.4.1 Group A inspection. Group A inspection shall be conducted in accordance with MIL-PRF-19500, and table I
herein. Electrical measurements (end-points) shall be in accordance with the applicable inspections of table I, group
A, subgroup 2 herein.
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