MIL-PRF-19500/461F
* TABLE I. Group A inspection - Continued.
1/
MIL-STD-750
Limit
Unit
Inspection
Symbol
Method
Conditions
Min
Max
Subgroup 2 - Continued.
3061
Emitter to base cutoff
0.5
mA dc
Bias condition D; VEB = 6 V dc
IEBO
current
Collector to base cutoff
3036
Bias condition D
15
mA dc
ICBO
current
2N6211
VCB = 275 V dc
2N6212
VCB = 350 V dc
2N6213
VCB = 400 V dc
2N6213A
VCB = 500 V dc
Forward-current transfer
3076
10
100
IC = 1 A dc, pulsed (see 4.5.1)
hFE1
ratio
2N6211
VCE = 2.8 V dc
2N6212
VCE = 3.2 V dc
2N6213
VCE = 4.0 V dc
2N6213A
VCE = 4.0 V dc
Forward-current transfer
3076
VCE = 5 V dc, IC = 1 A dc, pulsed
hFE2
ratio
(see 4.5.1)
2N6211
30
175
2N6212
30
175
30
150
2N6213
30
150
2N6213A
Collector to emitter
3071
VCE(sat)
IC = 1 A dc, IB = 0.125 A dc,
saturated voltage
pulsed (see 4.5.1)
2N6211
1.4
V dc
2N6212
1.6
V dc
2.0
V dc
2N6213
2.0
V dc
2N6213A
3066
1.4
V dc
Base to emitter saturated
Test condition A, IC = 1 A dc, IB =
VBE(sat)
voltage
0.125 A dc, pulsed (see 4.5.1)
Subgroup 3
TA = +100°C
High temperature operation:
Collector to emitter cutoff
3041
Bias condition A, VBE = 1.5 V dc
5
mA dc
ICEX2
current
2N6211
VCE = 250 V dc
2N6212
VCE = 315 V dc
2N6213
VCE = 360 V dc
2N6213A
VCE = 400 V dc
TA = -55°C
Low temperature operation:
Forward-current transfer
3076
10
VCE = 5.0 V dc, IC = 1 A dc,
hFE3
ratio
pulsed (see 4.5.1)
See footnote at end of table.
8
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