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MIL-PRF-19500-463 Semiconductor Device, Diode, Silicon, Current Regulator, Types 1N5283-1 Through 1N5314-1, And 1N5283Ur-1 Through 1N5314Ur-1, 1N7048-1 Through 1N7055 1, 1N7048Ur-1 Through 1N7055Ur-1, Jan, Jantx, Jantxv, Jans, Janhc, And JankcThis specification covers the performance requirements for 100 volt, silicon, current regulator diodes. Four levels of product assurance are provided for each encapsulated device type as specified in MIL-PRF-19500. Two levels of product assurance are provided for each unencapsulated device type.

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MIL-PRF-19500/463K
4.3.3 Thermal impedance ZθJX measurements for screening. The ZθJX measurements shall be performed in
accordance with method 3101 of MIL-STD-750, (VR to be used in lieu of VF). The maximum limit (not to exceed the
table I, subgroup 2 limit) for ZθJX in screening (table E-IV of MIL-PRF-19500) shall be derived by each vendor
bymeans of statistical process control. When the process has exhibited control and capability, the capability data
shall be used to establish the fixed screening limit. In addition to screening, once a fixed limit has been established,
monitor all future sealing lots using a random five piece sample from each lot to be plotted on the applicable X, R
chart. If a lot exhibits an out of control condition, the entire lot shall be removed from the line and held for engineering
evaluation and disposition.
IM measurement current
1 mA - 10 mA.
a.
IH forward heating current
.5 A - 1.0 A.
b.
c.
tH heating time
10 ms.
70 µs maximum.
d.
tMD measurement delay time
4.3.3.1 For initial qualification or requalification. Read and record data (ZθJX) shall be supplied to the qualifying
activity on one lot (random sample of 500 devices minimum) prior to shipment. Twenty-two samples shall be
serialized and provided to the qualifying activity for test correlation.
4.4 Conformance inspection. Conformance inspection shall be in accordance with MIL-PRF-19500 and as
specified herein.
4.4.1 Group A inspection. Group A inspection shall be conducted in accordance with MIL-PRF-19500, and table I
herein.
4.4.2 Group B inspection. Group B inspection shall be conducted in accordance with the conditions specified for
subgroup testing in tables E-VIA (JANS) and E-VIB (JAN, JANTX and JANTXV) of MIL-PRF-19500, and as follows.
Electrical measurements (end-points) and delta requirements shall be in accordance with table I, subgroup 2 herein.
4.4.2.1 Group B inspection, table E-VIA (JANS) of MIL-PRF-19500.
Subgroup
Method
Condition
2,000 cycles; test conditions in accordance with 4.3.2: ton = toff 30 seconds
B4
1037
minimum.
IR = 200 mA dc, TA = +125°C or adjusted as required to give an average lot
B5
1027
TJ = +175°C. Marking legibility requirements shall not apply.
4.4.2.2 Group B inspection, table E- VIB (JAN, JANTX, and JANTXV) of MIL-PRF-19500.
Subgroup
Method
Condition
VPOV = Col 11, table II; TA = +25°C; L = .375 inch (9.53 mm) (non-surface
B3
1027
mount), L = 0 inch for surface mount.
B5
Not applicable.
TA = +175°C.
B6
1032
10



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