MIL-PRF-19500/463K
3.8 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance
characteristics are as specified in 1.3, 1.4, and table I and the electrical characteristics table herein.
3.9 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table I herein.
3.10 Maximum test ratings. Test ratings shall be as shown in the electrical characteristics table.
3.11 Workmanship. Semiconductor devices shall be processed in such a manner as to be uniform in quality and
shall be free from other defects that will affect life, serviceability, or appearance.
4. VERIFICATION
4.1 Classification of inspections. The inspection requirements specified herein are classified as follows:
a. Qualification inspection (see 4.2).
b. Screening (see 4.3).
c. Conformance inspection (see 4.4).
4.2 Qualification inspection. Qualification inspection shall be in accordance with MIL-PRF-19500 and as specified
herein.
4.2.1 Group E qualification. Group E inspection shall be performed for qualification or re-qualification only. In
case qualification was awarded to a prior revision of the specification sheet that did not request the performance of
group E tests, the tests specified in 4.7.4 herein shall be performed on the first inspection lot to this revision to
maintain qualification.
4.2.2 JANHC and JANKC devices. Qualification for shall be in accordance with appendix G of MIL-PRF-19500.
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