MIL-PRF-19500-463 Semiconductor Device, Diode, Silicon, Current Regulator, Types 1N5283-1 Through 1N5314-1, And 1N5283Ur-1 Through 1N5314Ur-1, 1N7048-1 Through 1N7055 1, 1N7048Ur-1 Through 1N7055Ur-1, Jan, Jantx, Jantxv, Jans, Janhc, And JankcThis specification covers the performance requirements for 100 volt, silicon, current regulator diodes. Four levels of product assurance are provided for each encapsulated device type as specified in MIL-PRF-19500. Two levels of product assurance are provided for each unencapsulated device type.

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MIL-PRF-19500/463K

4.7.3 Temperature coefficient of regulator current (αIS). Temperature coefficient of regulator current shall be

calculated as follows:

αIS = __I__(____) - IS_(TL1 ) _ x 100

S TL2 _ _ __

IS (TL = +25�C)ĆTL

4.7.3.1 Alternate definition of temperature coefficient of regulator current (αIS). Temperature coefficient of

regulator current is allowed to also be calculated as follows:

αIS = _IP _TL2___I__(TL1 ) _ x 100

(

)- P

__ ___

___

IP (TL = +25�C)ĆTL

4.7.4 Group E inspection. Group E inspection shall be conducted in accordance with the conditions specified for

subgroup testing in table E-IX of MIL-PRF-19500. Electrical measurements (end-points) and delta requirements shall

be in accordance with the applicable steps and footnotes of table I, subgroup 2 herein.

4.7.4.1 Group E inspection, table E- IX of MIL-PRF-19500.

Inspections

Sample plan

Method

Condition

1051

500 cycles.

45 devices, c = 0

1037

6,000 cycles (see 4.3.2)

45 devices, c = 0

ton = toff = 30 seconds minimum.

2101

Cross section; scribe and break.

3 devices, c = 0

Separate samples to be used for

each test.

See table E-IX of MIL-PRF-19500,

subgroup 4.

1020

As applicable.

3 devices, c = 0