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MIL-PRF-19500-463 Semiconductor Device, Diode, Silicon, Current Regulator, Types 1N5283-1 Through 1N5314-1, And 1N5283Ur-1 Through 1N5314Ur-1, 1N7048-1 Through 1N7055 1, 1N7048Ur-1 Through 1N7055Ur-1, Jan, Jantx, Jantxv, Jans, Janhc, And JankcThis specification covers the performance requirements for 100 volt, silicon, current regulator diodes. Four levels of product assurance are provided for each encapsulated device type as specified in MIL-PRF-19500. Two levels of product assurance are provided for each unencapsulated device type.

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MIL-PRF-19500/463K

TABLE I. Group A inspection.

MIL-STD-750

Limit 2/

Inspection 1/

Symbol

Unit

Method

Conditions

Min

Max

Subgroup 1

Visual and mechanical

2071

examination

Subgroup 2

Regulator current

VS = 25 V dc, t = 90 s or thermal

Column 3

Column 4

mA dc

IS1 3/

equilibrium, 1N5283-1 through

1N5314-1

t = pulse measurement, 10 ms max

1N7048-1 through 1N7055-1,

TL = +30�C �3�C (see figure 5)

Limiting voltage

IL = .8 IS1 (min) 3/, column 3 of

Column 7

V dc

table II (see figure 6)

Reverse voltage

IR = 200 mA

2.5

V dc

�C/W

Thermal impedance

3101

See 4.3.3

ZθJX

Subgroup 3

Not applicable

Subgroup 4

MΩ

Regulator impedance

VS = 25 V dc; (see figure 7 and

Column 5

4.7.1)

MΩ

Knee impedance

VK = 6.0 V dc, (see figure 8 and

Column 6

4.7.2)

Subgroups 5 and 6

Not applicable

Subgroup 7

Regulator current

VS = column 11 of table II, t = 90 s

Column 10

mA dc

IS2 4/

or thermal equilibrium,

1N5283-1 through 1N5314-1

t = pulse measurement, 10 ms max

1N7048-1 through 1N7055-1,

TL = +30�C �3�C (see figure 5)

For sampling plan, see MIL-PRF-19500.

Column references are to table II herein.

Symbol "IP1" may be used in place of "IS1".

Symbol "IP2" may be used in place of "IS2".