MIL-PRF-19500/495G
* TABLE I. Group A inspection - Continued.
Inspection 1/
MIL-STD-750
Limit
Unit
Symbol
Method
Conditions
Min
Max
Subgroup 3
High temperature operation
TA = +150°C
Collector to base cutoff current
3036
10
µA dc
Bias condition D; VCB = 50 V dc
ICBO3
Low temperature operation
TA = -55°C
Forward-current transfer ratio
3076
VCE = 10 V dc; IC = 150 mA dc
hFE7
2N5793
16
2N5794, 2N5794U, 2N5794UC
40
Subgroup 4
Magnitude of small-signal short-
3306
2
10
VCE = 20 V dc; IC = 20 mA dc;
| hfe |
circuit forward current transfer
f = 100 MHz
ratio
Open circuit output capacitance
3236
8
pF
VCB = 10 V dc; IE = 0;
Cobo
100 kHz < f < 1 MHz
Input capacitance (output open-
3240
33
pF
VEB = 0.5 V dc; IC = 0;
Cibo
circuited)
100 kHz < f < 1 MHz
Pulse response
3251
Test condition A, (see figure 7)
Saturated turn-on time
45
ns
VCC = 30 V dc; IC = 150 mA dc;
ton
IB1 = 15 mA dc,
VBE(OFF) = 0.5 V dc
Saturated turn-off time
310
ns
VCC = 30 V dc; IC = 150 mA dc;
toff
IB1 = IB2 =15 mA dc
Subgroups 5 and 6
Not required
1/ For sampling plan see MIL-PRF-19500.
2/ For resubmission of failed test in subgroup 1 of table I, double the sample size of the failed test or sequence of
tests. A failure in table I, subgroup 1 shall not require retest of the entire subgroup. Only the failed test shall be
rerun upon submission.
3/ Separate samples may be used.
4/ Not required for JANS devices.
5/ Not required for laser marked devices.
6/ This hermetic seal test is an end-point to temp-cycling in addition to electrical measurements.
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