MILPRF19500/539F
3. REQUIREMENTS
3.1 General. The individual item requirements shall be as specified in MILPRF19500 and as modified herein.
3.2 Qualification. Devices furnished under this specification shall be products that are manufactured by a
manufacturer authorized by the qualifying activity for listing on the applicable qualified manufacturers list before
contract award (see 4.2 and 6.3).
3.3 Abbreviations, symbols, and definitions. Abbreviations, symbols, and definitions used herein shall be as
specified in MILPRF19500 and as follows:
IM
The measurement current applied to forward bias the junction for measurement of VBE.
IH
The collector current applied to the device under test during the heating period.
The duration of the applied heating power pulse.
tH
tSW
Sample window time during which final VBE measurement is made.
3.4 Interface and physical dimensions. The interface and physical dimensions shall be as specified in
MILPRF19500, and on figure 1 herein.
3.4.1 Lead finish. The lead finish shall be solderable in accordance with MILPRF19500, MILSTD750, and
herein. Where a choice of lead finish is desired, it shall be specified in the acquisition document (see 6.2).
3.4.2 Polarity. The polarity of the device types shall be as shown on figure 1.
3.5 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance
3.6 Electrical test requirements. The electrical test requirements shall be as specified in table I.
3.7 Marking. Marking shall be in accordance with MILPRF19500.
3.8 Workmanship. Semiconductor devices shall be processed in such a manner as to be uniform in quality and
shall be free from other defects that will affect life, serviceability, or appearance.
4. VERIFICATION
4.1 Classification of inspections. The inspection requirements specified herein are classified as follows:
a.
Qualification inspection (see 4.2).
b.
Screening (see 4.3).
c.
4.2 Qualification inspection. Qualification inspection shall be in accordance with MILPRF19500 and as specified
herein.
4.2.1 Group E qualification. Group E inspection shall be performed for qualification or re-qualification only. In
case qualification was awarded to a prior revision of the specification sheet that did not request the performance of
table II tests, the tests specified in table II herein that were not performed in the prior revision shall be performed on
the first inspection lot of this revision to maintain qualification.
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