MIL-PRF-19500-539 Semiconductor Device, Transistor, Npn, Silicon, Power Darlington, Types 2N6300 And 2N6301, Jan, Jantx, And JantxvThis specification covers the performance requirements for NPN silicon, power Darlington transistors. Three levels of product assurance are provided for each device type as specified in MIL┬ûPRF┬û19500.

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MIL�PRF�19500/539F

4.3 Screening (JANTX and JANTXV levels only). Screening shall be in accordance with table E�IV of

MIL�PRF�19500, and as specified herein. The following measurements shall be made in accordance with table I

herein. Devices that exceed the limits of table I herein shall not be acceptable.

Screen (see table E�IV

Measurement

JANTX and JANTXV levels

3c (1)

Thermal impedance, see 4.3.1

ICEX1 and hFE2

ĆICEX1 = �100 percent of initial value or 100 nA dc, whichever is greater.

ĆhFE2 = �40 percent of initial value.

See 4.3.2

See table I, subgroup 2 herein.

ĆICEX1 = 100 percent of initial value or 100 nA dc, whichever is greater.

ĆhFE2 = �40 percent of initial value.

(1) Thermal impedance shall be performed anytime after temperature cycling (screen 3a) and does not need to

be repeated in screening requirements.

4.3.1 Thermal impedance. The thermal impedance measurements shall be performed in accordance with test

method 3131 of MIL�STD�750 using the guidelines in that method for determining IH, IM, tH, tSW (and VH where

appropriate). The thermal impedance limit used in screen 3c and table I, subgroup 2 herein shall be set statistically

by the supplier. Measurement delay time (tMD) = 70 �s maximum. See table II, subgroup 4 (group E) herein.

4.3.2 Power burn-in conditions. Power burn-in conditions shall be as follows: TJ = +162.5�C �12.5�C,

VCE ≥ 10 V dc. NOTE: No heat sink or forced air cooling on the devices shall be permitted.

4.4 Conformance inspection. Conformance inspection shall be in accordance with MIL�PRF�19500.

4.4.1 Group A inspection. Group A inspection shall be conducted in accordance with table E�V of

MIL�PRF�19500 and table I herein. Electrical measurements (end-points) shall be in accordance with table I

subgroup 2 herein.

4.4.2 Group B inspection. Group B inspection shall be conducted in accordance with the tests and conditions

specified for subgroup testing in appendix E, table E�VIB (JAN, JANTX, and JANTXV) of MIL�PRF�19500 and as

follows. Electrical measurements (end-points) shall be in accordance with table I, subgroup 2 herein.

Subgroup

Method

Conditions

VCE ≥ 10 V dc, 2,000 cycles, adjust device current, or power, to achieve a

1037

minimum ĆTJ of +100�C.