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MIL-PRF-19500-565 Semiconductor Device, Field Effect Transistor, P-Channel, Silicon, Types 2N6895, 2N6896, 2N6897, And 2N6898, Jan, Jantx, Jantxv, And JansThis specification covers the performance requirements for P-channel, enhancement-mode, MOSFET, power transistors. Four levels of product assurance are provided for each encapsulated device type as specified in MIL-PRF-19500.

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MIL-PRF-19500/565E
4.4.2 Group B inspection. Group B inspection shall be conducted in accordance with the conditions specified for
subgroup testing in table E-VIA (JANS) and table E-VIB (JAN, JANTX, and JANTXV) of MIL-PRF-19500 and herein.
Electrical measurements (end-points) shall be in accordance with the inspections of table I, subgroup 2 herein.
* 4.4.2.1 Group B inspection table E-VIA (JANS) of MIL-PRF-19500.
Subgroup
Method
Conditions
B3
1051
Test condition G.
B3
2077
SEM.
*
B4
1042
Test condition D; 2,000 cycles. The heating cycle shall be 1 minute minimum.
2N6895, VDS = -10 V dc, PT = 0.6 W at TA = +25°C ±3°C.
2N6896, 2N6897, 2N6898, VDS = -20 V dc, PT = 4 W at TA = +25°C ±3°C.
Accelerated steady-state operation life; test condition C; TA = +25°C, -5°C, +10°C,
B5
1042
VDS = 10 V min.; ID adjusted to meet a junction temperature of +140°C, -0°C, +10°C,
t = 240 hours.
B5
2037
Bond strength, test condition A.
4.4.2.2 Group B inspection, table E-VIB (JAN, JANTX, and JANTXV) of MIL-PRF-19500.
Subgroup
Method
Condition
B2
1051
Test condition G, 25 cycles.
B3
1042
Test condition D, 2,000 cycles. The heating cycle shall be 1 minute minimum.
* 4.4.3 Group C inspection. Group C inspection shall be conducted in accordance with the conditions specified for
subgroup testing in table E-VII of MIL-PRF-19500 and as follows. Electrical measurements (end-points) shall be in
accordance with the inspections of table I, subgroup 2 herein.
Subgroup
Method
Condition
C2
2036
Test condition E for TO-205AF (figure 1); test condition A, 10 lbs, 15 s for TO-3
(figure 2).
See 4.3.3, RθJC = see 1.3.
*
C5
3161
C6
1042
Test condition D, 6,000 cycles. The heating cycle shall be 1 minute minimum.
4.4.4 Group E inspection. Group E inspection shall be conducted in accordance with the conditions specified for
subgroup testing in table E-IX of MIL-PRF-19500 and as specified in table II herein. Electrical measurements (end-
points) shall be in accordance with the inspections of table I, subgroup 2 herein.
4.5 Methods of inspection. Methods of inspection shall be as specified in the appropriate tables and as follows.
4.5.1 Pulse measurements. Conditions for pulse measurement shall be as specified in section 4 of MIL-STD-750.
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