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MIL-PRF-19500-570 Semiconductor Device, Transistor, Field Effect, N-Channel, Silicon Logic-Level, Types 2N6901 And 2N6903, Jan, Jantx, Jantxv, Jans, Janhc, And JankcThis specification covers the performance requirements for a logic-level N-channel, enhancement-mode, MOSFET, power transistor. Four levels of product assurance are provided for each device type as specified in MIL-PRF-19500. Two levels of product assurance are also provided for each unencapsulated device type. See 6.4 or JANHC and JANKC die versions.

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MIL-PRF-19500/570E
* 4.4.3 Group C inspection. Group C inspection shall be conducted in accordance with the conditions specified for
subgroup testing in appendix E, table E-VII of MIL-PRF-19500, and as follows. Electrical measurements (end-points)
shall be in accordance with table I, subgroup 2 herein.
Subgroup
Method
Conditions
C2
2036
Test condition E.
See 4.3.4, RθJC(max) = 15°C /W.
*
C5
3161
C6
1042
Test condition D: 6,000 cycles. The heating cycle shall be 30 seconds minimum.
4.4.4 Group E inspection. Group E inspection shall be conducted in accordance with the conditions specified for
subgroup testing in appendix E, table E-IX of MIL-PRF-19500, and table II herein. Electrical measurements (end-
points) shall be in accordance with table I, subgroup 2 herein.
4.5 Methods of inspection. Methods of inspection shall be as specified in the appropriate tables and as follows:
4.5.1 Pulse measurements. Conditions for pulse measurements shall be as specified in section 4 of MIL-STD-750.
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