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MIL-PRF-19500-570 Semiconductor Device, Transistor, Field Effect, N-Channel, Silicon Logic-Level, Types 2N6901 And 2N6903, Jan, Jantx, Jantxv, Jans, Janhc, And JankcThis specification covers the performance requirements for a logic-level N-channel, enhancement-mode, MOSFET, power transistor. Four levels of product assurance are provided for each device type as specified in MIL-PRF-19500. Two levels of product assurance are also provided for each unencapsulated device type. See 6.4 or JANHC and JANKC die versions.

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MIL-PRF-19500/570E
TABLE I. Group A inspection - Continued.
Inspection 1/
MIL-STD-750
Symbol
Limits
Unit
Method
Conditions
Min
Max
Subgroup 7 - Continued
Gate to source charge
Qgs
2N6901
1.0
nC
2N6903
0.8
nC
Gate to drain charge
Qgd
2.9
nC
2N6901
2N6903
2.7
nC
VDD < 30 V; di/dt = 100 A/µs
Reverse recovery time
3473
trr
IF = 1 A
2N6901
250
ns
2N6903
500
ns
1/
For sampling plan, see MIL-PRF-19500.
2/
This test required for the following end-point measurements only:
Group B, subgroups 3 and 4 (JANS).
Group B, subgroups 2 and 3 (JAN, JANTX, and JANTXV).
Group C, subgroup 2 and 6.
Group E, subgroup 1.
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