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MIL-PRF-19500-570 Semiconductor Device, Transistor, Field Effect, N-Channel, Silicon Logic-Level, Types 2N6901 And 2N6903, Jan, Jantx, Jantxv, Jans, Janhc, And JankcThis specification covers the performance requirements for a logic-level N-channel, enhancement-mode, MOSFET, power transistor. Four levels of product assurance are provided for each device type as specified in MIL-PRF-19500. Two levels of product assurance are also provided for each unencapsulated device type. See 6.4 or JANHC and JANKC die versions.

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MIL-PRF-19500/570E
* 4.3.1 Screening (JANHC and JANKC). Screening of die shall be in accordance with MIL-PRF-19500. As a
minimum, die shall be 100-percent probed in accordance with table I, subgroup 2.
4.3.2 Gate stress test. Apply VGS = 15 V min. for t = 250 µs min.
4.3.3 Unclamped inductive switching.
a. Peak current, ID .............................................. rated ID1.
b. Peak gate voltage, VGS ................................... 10 V.
c. Gate to source resistor, RGS .......................... 25 Ω < RGS < 200 Ω.
*
d. Initial case temperature .................................. +25°C, +10°C -5°C.
e. Inductance ..................................................... 100 µH ±10 percent.
f. Number of pulses to be applied ...................... 1 pulse.
4.3.4 Thermal impedance. The thermal impedance measurements shall be performed in accordance with method
3161 of MIL-STD-750 using the guidelines in that method for determining IM, IH, tH, tSW, (VC and VH where
appropriate). Measurement delay time (tMD) = 70 µs max. See table II, group E, subgroup 4 herein.
4.4 Conformance inspection. Conformance inspection shall be in accordance with MIL-PRF-19500 and as
specified herein.
4.4.1 Group A inspection. Group A inspection shall be conducted in accordance with table E-V of MIL-PRF-19500,
and table I herein. Electrical measurements (end-points) shall be in accordance with table I, subgroup 2 herein.
4.4.2 Group B inspection. Group B inspection shall be conducted in accordance with the conditions specified for
subgroup testing in appendix E, table E-VIA (JANS) and table E-VIB (JAN, JANTX, and JANTXV) of MIL-PRF-19500,
and as follows. Electrical measurements (end-points) shall be in accordance with table I, subgroup 2 herein.
4.4.2.1 Group B inspection, appendix E, table E-VIA (JANS) of MIL-PRF-19500.
Subgroup
Method
Conditions
B3
1051
Test condition G.
B3
2077
SEM.
B4
1042
Test condition D: 2,000 cycles. The heating cycle shall be 1 minute minimum.
Test condition A, VDS = rated, TA = +175°C, t = 120 hours.
B5
1042
Test condition B, VGS = rated, TA = +175°C, t = 24 hours.
B5
1042
B5
2037
Test condition D.
4.4.2.2 Group B inspection, appendix E, table E-VIB (JAN, JANTX, and JANTXV) of MIL-PRF-19500.
Subgroup
Method
Conditions
B2
1051
Test condition G.
B3
1042
Test condition D: 2,000 cycles. The heating cycle shall be 30 seconds minimum.
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