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MIL-PRF-19500-599 Semiconductor Device, Transistors, Quad, Field Effect, P-Channel, Silicon, Type 2N7335, Jan, Jantx, Jantxv, Jans, Janhc, And JankcThis specification covers the performance requirements for quad P-channel, enhancement-mode, MOSFET, power transistor with avalanche energy ratings \(EAS and EAR\) and maximum avalanche current \(IAR\). Four levels of product assurance are provided for each encapsulated device type as specified in MIL?√PRF?√19500. Two levels of product assurance for each unencapsulated device type die \(element evaluation\) as specified in MIL?√PRF?√19500.

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MIL­PRF­19500/599E
4.4.2.1 Quality level JANS (table E­VIA of MIL­PRF­19500).
Subgroup
Method
Conditions
B3
1051
Condition G.
Gate stress; condition B, TA = +175°C, t = 24 hours.
B5
1042
Reverse bias; condition A, TA = +175°C, t = 120 hours. Read and record VBR(DSS)
B5
1042
(pre and post) at ID = 1 mA.
See 4.5.2.
B6
3161
4.4.2.2 Quality levels JAN, JANTX, and JANTXV (table E­VIB of MIL­PRF­19500).
Subgroup
Method
Conditions
B2
1051
Condition G.
B3
1042
Condition D, the heating cycle shall be 1 minute minimum.
4.4.3 Group C inspection. Group C inspection shall be conducted in accordance with the conditions specified for
subgroup testing in table E­VII of MIL­PRF­19500 and as follows herein. Electrical measurements (end-points) shall
be in accordance with table I, subgroup 2 herein. Delta requirements shall be in accordance with the applicable steps
of table II herein.
Subgroup
Method
Conditions
C2
2036
Condition E. The sampling plan applies to the number of leads tested. A minimum
of three devices shall be tested.
C5
3161
See 4.5.2.
C6
1042
Condition D, the heating cycle shall be 1 minute minimum.
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