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MIL-PRF-19500-599 Semiconductor Device, Transistors, Quad, Field Effect, P-Channel, Silicon, Type 2N7335, Jan, Jantx, Jantxv, Jans, Janhc, And JankcThis specification covers the performance requirements for quad P-channel, enhancement-mode, MOSFET, power transistor with avalanche energy ratings \(EAS and EAR\) and maximum avalanche current \(IAR\). Four levels of product assurance are provided for each encapsulated device type as specified in MIL?√PRF?√19500. Two levels of product assurance for each unencapsulated device type die \(element evaluation\) as specified in MIL?√PRF?√19500.

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MIL­PRF­19500/599E
4.3.1.1 Gate stress test. Apply VGS = +30 V minimum for t = 250 µs minimum.
4.3.1.2 Single pulse avalanche energy (EAS). The single pulse avalanche energy capability shall be performed in
accordance with method 3470 of MIL­STD­750. The following details shall apply:
a.
Peak current (IAS)
ID1.
­10 V.
b.
Peak gate voltage (VGS)
25 ≤ RGS ≤ 200Ω.
Gate to source resistor (RGS)
c.
+25°C +10°C, ­5°C.
d.
Initial case temperature
2 E  AS  (V  BR - V  DD )
2 
e.
Inductance
mH minimum
( I  D1 )  
V  BR
f.
Number of pulses to be applied
1 pulse minimum.
Supply voltage (VDD)
­25 V minimum.
g.
4.3.1.3 Thermal impedance (ZθJC measurements). The thermal impedance measurements shall be performed in
accordance with method 3161 of MIL­STD­750 using the guidelines in that method for determining IM, IH, tH, tSW,
(and VH where appropriate). Measurement delay time (tMD) = 70 µs maximum. (See figure 4 herein for thermal
response curves.) See table II, group E, subgroup 4 herein.
4.3.2 Screening of unencapsulated die (JANHC and JANKC). Screening of JANHC and JANKC unencapsulated
die shall be in accordance with appendix G of MIL­PRF­19500. The burn-in duration for JANKC level shall follow the
JANS requirements; the JANHC level shall follow the JANTX requirements of table E­IV of MIL­PRF­19500. As a
minimum, die shall be 100 percent probed in accordance with group A.
4.4 Conformance inspection. Conformance inspection shall be in accordance with MIL­PRF­19500, and as
specified herein. Alternate flow is allowed for conformance inspection in accordance with MIL­PRF­19500.
4.4.1 Group A inspection. Group A inspection shall be conducted in accordance with table E­V of
MIL­PRF­19500, and table I herein. Electrical measurements (end-points) shall be in accordance with table I,
subgroup 2 herein. Delta requirements shall be in accordance with the applicable steps of table II herein.
4.4.2 Group B inspection. Group B inspection shall be conducted in accordance with the conditions specified for
subgroup testing in table E­VIA (JANS) and table E­VIB (JAN, JANTX, and JANTXV) of MIL­PRF­19500 and
herein. Electrical measurements (end-points) shall be in accordance with table I, subgroup 2 herein. Delta
requirements shall be in accordance with the applicable steps of table II herein.
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