MIL-PRF-19500-599 Semiconductor Device, Transistors, Quad, Field Effect, P-Channel, Silicon, Type 2N7335, Jan, Jantx, Jantxv, Jans, Janhc, And JankcThis specification covers the performance requirements for quad P-channel, enhancement-mode, MOSFET, power transistor with avalanche energy ratings \(EAS and EAR\) and maximum avalanche current \(IAR\). Four levels of product assurance are provided for each encapsulated device type as specified in MIL?√PRF?√19500. Two levels of product assurance for each unencapsulated device type die \(element evaluation\) as specified in MIL?√PRF?√19500.

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MIL�PRF�19500/599E

4.3.1.1 Gate stress test. Apply VGS = +30 V minimum for t = 250 �s minimum.

4.3.1.2 Single pulse avalanche energy (EAS). The single pulse avalanche energy capability shall be performed in

accordance with method 3470 of MIL�STD�750. The following details shall apply:

Peak current (IAS)

ID1.

�10 V.

Peak gate voltage (VGS)

25 ≤ RGS ≤ 200Ω.

Gate to source resistor (RGS)

+25�C +10�C, �5�C.

Initial case temperature

 2 E AS  (V BR - V DD )



2 

Inductance

 mH minimum

( I D1 )  



V BR

Number of pulses to be applied

1 pulse minimum.

Supply voltage (VDD)

�25 V minimum.

4.3.1.3 Thermal impedance (ZθJC measurements). The thermal impedance measurements shall be performed in

accordance with method 3161 of MIL�STD�750 using the guidelines in that method for determining IM, IH, tH, tSW,

(and VH where appropriate). Measurement delay time (tMD) = 70 �s maximum. (See figure 4 herein for thermal

response curves.) See table II, group E, subgroup 4 herein.

4.3.2 Screening of unencapsulated die (JANHC and JANKC). Screening of JANHC and JANKC unencapsulated

die shall be in accordance with appendix G of MIL�PRF�19500. The burn-in duration for JANKC level shall follow the

JANS requirements; the JANHC level shall follow the JANTX requirements of table E�IV of MIL�PRF�19500. As a

minimum, die shall be 100 percent probed in accordance with group A.

4.4 Conformance inspection. Conformance inspection shall be in accordance with MIL�PRF�19500, and as

specified herein. Alternate flow is allowed for conformance inspection in accordance with MIL�PRF�19500.

4.4.1 Group A inspection. Group A inspection shall be conducted in accordance with table E�V of

MIL�PRF�19500, and table I herein. Electrical measurements (end-points) shall be in accordance with table I,

subgroup 2 herein. Delta requirements shall be in accordance with the applicable steps of table II herein.

4.4.2 Group B inspection. Group B inspection shall be conducted in accordance with the conditions specified for

subgroup testing in table E�VIA (JANS) and table E�VIB (JAN, JANTX, and JANTXV) of MIL�PRF�19500 and

herein. Electrical measurements (end-points) shall be in accordance with table I, subgroup 2 herein. Delta

requirements shall be in accordance with the applicable steps of table II herein.