MIL-PRF-19500/611A
4. QUALITY ASSURANCE PROVISIONS
4.1 Classification of inspections. The inspection requirements specified herein are classified as follows:
a.
Qualification inspection (see 4.2).
b.
Screening (see 4.3)
c.
Conformance inspection (see 4.4).
4.2 Qualification inspection. Qualification inspection shall be in accordance with MIL-PRF-19500.
4.3 Screening ( JANS, JANTX and JANTXV levels only). Screening shall be in accordance with MIL-PRF-19500 (Appendix E, table
IV), and as specified herein. The following measurements shall be made in accordance with table I herein. Devices that exceed the limits
of table I herein shall not be acceptable.
| Screen (see appendix E, |
Measurement
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| table IV of
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| MIL-PRF-19500)
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JANS level
| JANTX and JANTXV levels
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1/
| Thermal impedance (see 4.3.2)
| Thermal impedance (see 4.3.2)
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9
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ICES1 and hFE2
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Not applicable
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11
| Subgroup 2 of table I herein;
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ICES1 and hFE2
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| ICES1 and hFE2; ĆICES1 = 100% of
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| initial value or 20 nA dc whichever is
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| greater. ĆhFE2 = ± 15% of initial value.
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12
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t = 160 hours
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t = 80 hours
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13
| Subgroups 2 and 3 of table I herein;
| Subgroup 2 of table I herein;
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| ICES1 and hFE2;ĆICES1 = 100%
| ICES1 and hFE2; ĆICES1 = 100%
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| of initial value or 20 nA dc whichever is
| of initial value or 20 nA dc whichever
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| greater. ĆhFE2 = ± 15% of initial value.
| is greater. ĆhFE2= ± 15% of initial value.
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1/ May be performed anytime before screen 9.
4.3.1 Power burn-in conditions. Power burn-in conditions are as follows:
TJ = 187.5 ± 12.5°C, VCE ≥ 20 V dc, TA ≤ 100°C
4.3.2 Thermal impedance (ZθJX measurements). The ZθJX measurements shall be performed in accordance with MIL-STD-750,
method 3131. The maximum limit (not to exceed the Group A, Subgroup 2 limit) for ZθJX in screening (appendix E, table IV of MIL-PRF-
19500) shall be derived by each vendor by means of statistical process control. When the process has exhibited control and capability,
the capability data shall be used to establish the fixed screening limit. In addition to screening, once a fixed limit has been established,
monitor all future sealing lots using a random five piece sample from each lot to be plotted on the applicable X, R chart. If a lot exhibits an
out of control condition, the entire lot shall be removed from the line and held for Engineering evaluation and disposition.
4.3.2.1 For initial qualification or requalification. Read and record data (ZθJX) shall be supplied to the qualifying activity on one lot
(random sample of 500 devices minimum). Twenty-two serialized devices shall be sent to the qualifying activity for test correlation.
4.4 Conformance inspection. Conformance inspection shall be in accordance with MIL-PRF-19500, and as specified herein.
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