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MIL-PRF-19500-615 Semiconductor Device, Filed Effect Radiation Hardened Transistors, P-Channel, Silicon, Types 2N7382 And 2N7383, Jantxv M, D, R, And F And Jans M, D, R, And FThis specification covers the performance requirements for a P-channel, radiation hardened, enhancement mode, MOSFET, power transistor intended for use in high density power switching applications. Two levels of product assurance are provided for each device type as specified in MIL-PRF-19500, with avalanche energy ratings \(EAS\) and maximum avalanche current \(IAS\). See 6.5 for JANHC and JANKC die versions.

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MIL-PRF-19500/615G
4.4.2 Group B inspection. Group B inspection shall be conducted in accordance with the conditions specified for
subgroup testing in table E-VIA (JANS) and table E-VIB (JANTXV) of MIL-PRF-19500, and as follows. Electrical
measurements (end-points) shall be in accordance with table I, subgroup 2 herein.
4.4.2.1 Group B inspection, table E-VIA (JANS) of MIL-PRF-19500.
Subgroup
Method
Condition
B3
1051
Condition G.
B4
1042
The heating cycle shall be 1 minute minimum.
Condition A; VDS = 100 percent of rated; TA = +175°C; t = 120 hours or TA = +150°C;
B5
1042
t = 240 hours (manufacturers option).
Condition B; VGS = 100 percent of rated; TA = +175°C; t = 24 hours or TA = +150°C;
B5
1042
t = 48 hours (manufacturers option).
4.4.2.2 Group B inspection, table E-VIB (JANTXV) of MIL-PRF-19500.
Subgroup
Method
Condition
B2
1051
Test condition G.
B3
1042
The heating cycle shall be 1 minute minimum.
B3
2037
Test condition D.
4.4.3 Group C inspection. Group C inspection shall be conducted in accordance with the conditions specified for
subgroup testing in table E-VII of MIL-PRF-19500, and as follows. Electrical measurements (end-points) shall be in
accordance with table I, subgroup 2 herein.
Subgroup
Method
Condition
C2
2036
Test condition A, weight = 10 lbs. (4.54 Kg), t = 10 seconds.
See 4.3.3, RθJC(max) = 1.67°C/W.
C5
3161
C6
1042
The heating cycle shall be 1 minute minimum.
4.4.4 Group D inspection. Group D inspection shall be conducted in accordance with table E-VIII of
4.4.5 Group E inspection. Group E inspection shall be conducted in accordance with the conditions specified for
subgroup testing in table E-IX of MIL-PRF-19500 and as specified in table III herein. Electrical measurements (end-
points) shall be in accordance with table I, subgroup 2 herein.
4.5 Methods of inspection. Methods of inspection shall be as specified in appropriate tables and as follows.
4.5.1 Pulse measurements. Conditions for pulse measurements shall be as specified in section 4 of
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