MIL-PRF-19500-117 Semiconductor Devices, Diode, Silicon, Voltage Regulator, Types 1N962B- 1 Through 1N992B-1, And 1N962Bur-1 Through 1N992Bur-1, 1N962C-1 Through 1N992C-1, And 1N962Cur-1 Through 1N992Cur-1, And 1N962D-1 Through 1N992D-1, 1N962Dur-1 Through 1N992Dur-1, Jan, Jantx, Jantxv, Janhc And JankcThis specification covers the performance requirements for 500 milliwatt, silicon, voltage regulator diodes with voltage tolerances of 5 percent, 2 percent, and 1 percent. Three levels of product assurance are provided for each encapsulated device type as specified in MIL-PRF-19500. One level of product assurance is provided for each unencapsulated device type.

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MIL-PRF-19500/117R

TABLE II. Group E inspection qualification and requalification (all product assurance levels).

Qualification conformance

MIL-STD-750

Inspection 1/

inspection (sampling plan)

Method

Conditions

Subgroup 1

45 devices, c = 0

Temperature cycling

1051

500 cycles

Electrical measurements

See table III, steps 1, 2, 3, 4, and 5

Subgroup 2

45 devices, c = 0

Intermittent life

1037

6,000 cycles. IZ = column 8 of table IV

Electrical measurements

See table III, steps 2, 3, 4, and 5

Subgroup 4

See MIL-PRF-19500

Thermal impedance curve

Subgroups 5 and 6

Not applicable

Subgroup 9

n = 45

1057

Condition B. Cool down after solder

Resistance to glass

immersion is permitted. Test until failure

cracking

occurs on all devices with the chosen sample

or to a maximum of 25 cycles, whichever

comes first

1/ A separate sample may be pulled for each test.