MIL-PRF-19500-117 Semiconductor Devices, Diode, Silicon, Voltage Regulator, Types 1N962B- 1 Through 1N992B-1, And 1N962Bur-1 Through 1N992Bur-1, 1N962C-1 Through 1N992C-1, And 1N962Cur-1 Through 1N992Cur-1, And 1N962D-1 Through 1N992D-1, 1N962Dur-1 Through 1N992Dur-1, Jan, Jantx, Jantxv, Janhc And JankcThis specification covers the performance requirements for 500 milliwatt, silicon, voltage regulator diodes with voltage tolerances of 5 percent, 2 percent, and 1 percent. Three levels of product assurance are provided for each encapsulated device type as specified in MIL-PRF-19500. One level of product assurance is provided for each unencapsulated device type.

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MIL-PRF-19500/117R

4. VERIFICATION

4.1 Classification of inspections. The inspection requirements specified herein are classified as follows:

a. Qualification inspection (see 4.2).

b. Screening (see 4.3).

c. Conformance inspection (see 4.4).

4.2 Qualification inspection. Qualification inspection shall be in accordance with MIL-PRF-19500 and as specified

herein.

4.2.1 Group E qualification. Group E inspection shall be performed for qualification or re-qualification only. In

case qualification was awarded to a prior revision of the specification sheet that did not request the performance of

table II tests, the tests specified in table II herein that were not performed in the prior revision shall be performed on

the first inspection lot of this revision to maintain qualification.

4.2.2 JANHC devices. JANHC devices shall be qualified in accordance with appendix G of MIL-PRF-19500.

4.2.3 Construction verification. Cross sectional photos from three devices shall be submitted in the qualification

report.

4.3 Screening (JAN, JANTX, and JANTXV levels only). Screening shall be in accordance with table E-IV of

MIL-PRF-19500 and as specified herein. The following measurements shall be made in accordance with table I

herein. Devices that exceed the limits of table I herein shall not be acceptable.

Measurement

Screen

(see table E-IV of

JANTX and JANTXV levels

MIL-PRF-19500)

Temperature cycling

(1) 3c

Thermal impedance (see 4.3.2)

Not required

Optional

Not required

IR1 and VZ

See 4.3.3

ΔIR1 ≤ 100 percent of initial reading or 50 nA dc,

(2) 13

whichever is greater.

ΔVZ ≤ �2 percent initial reading.

Subgroup 2 of table I herein.

14a

Not required

(3) 14b

Required

(1) Thermal impedance shall be performed any time after sealing provided temperature cycling is performed in

accordance with MIL-PRF-19500, screen 3 prior to this thermal test.

(2) PDA = 5 percent for screen 13 applies to ΔIR1 and ΔVZ. Thermal impedance (ZΘJX) is not required in screen

13.

(3) For clear glass diodes, the hermetic seal (gross leak) may be performed at anytime after temperature cycling.