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MIL-PRF-19500-156 Semiconductor Device, Diode, Silicon, Low Level Voltage-Reference Temperature Compensated, Types 1N935B-1, 1N937B-1, 1N938B-1, 1N939B-1, And 1N940B-1, 1N935Bur-1, 1N937Bur-1, 1N938Bur-1, 1N939Bur-1, And 1N940Bur-1, Jan, Jantx, Jantxv, And Jans, Radiation Hardened \(Total Dose Only\) Types Jantxvm, D, L, R, F, G, H, Jansm, D, L, R, F, G, HThis specification covers the performance requirements for 9.0 volts ┬▒5 percent, silicon, low bias current, voltage-reference diodes. Four levels of product assurance are provided for each encapsulated device type as specified in MIL-PRF-19500. Seven levels of radiation hardened \(total dose only\) product assurance are provided for each encapsulated device type as specified in MIL-PRF-19500.

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MIL-PRF-19500/156N
4.4 Conformance inspection. Conformance inspection shall be in accordance with MIL-PRF-19500.
4.4.1 Group A inspection. Group A inspection shall be conducted in accordance with appendix E, table E-V of
MIL-PRF-19500 and table I herein.
4.4.2 Group B inspection. Group B inspection shall be conducted in accordance with the conditions specified for
subgroup testing in table E-VIa (JANS) and table E-VIb (JAN, JANTX and JANTXV) of MIL-PRF-19500. Electrical
measurements (end-points) shall be in accordance with the applicable steps of table I, subgroup 2 herein.
4.4.2.1 Group B inspection, table E-VIa (JANS) of MIL-PRF-19500. For purposes of JANS inspection, a single
device type shall be defined as devices from a single wafer lot (for each die type used in the construction). The
conformance inspection sample shall be selected from the part category with the lowest ΔVZ rating in the inspection
lot.
Method
Conditions
Subgroup
B1
2066
As specified.
B2
2026
As specified.
B2
1022
As specified.
B3
1056
Test condition A, 25 cycles.
B3
4066
Not applicable.
B3
1071
Test condition E.
B3
2075
As specified.
B4
1037
IZ = 25 mA dc at TA = room ambient; ton = toff = 30 seconds minimum for
4,000 cycles. Forced air cooling allowed during off cycle.
IZM = 50 mA dc for 96 hours. TA = +75°C, adjust TA to achieve TJ = +200°C
B5
1027
minimum.
B6
Not applicable.
4.4.2.2 Group B inspection, table E-VIb (JAN, JANTX and JANTXV) of MIL-PRF-19500.
Method
Conditions
Subgroup
B1
2026
As specified.
B1
1022
As specified.
B2
1056
Test condition A, 25 cycles.
B2
4066
Not applicable.
B2
1071
Test condition E.
B3
1027
See 4.3.1.
B4
2075
As specified.
B5
Not applicable.
B6
1032
As specified.
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