MIL-PRF-19500/156N
4.4.3 Group C inspection. Group C inspection shall be conducted in accordance with the conditions specified for
subgroup testing in appendix E, table E-VII of MIL-PRF-19500. Electrical measurements (end-points) requirements
shall be in accordance with the applicable steps of table I, subgroup 2 herein.
4.4.3.1 Group C inspection, appendix E table E-VII of MIL-PRF-19500.
Method
Conditions
Subgroup
C1
2066
As specified.
C2
1056
Test condition A, 25 cycles.
C2
2036
Tension: Test condition A; 4 pounds weight, t = 15 ±3 seconds; Lead fatigue: Test
condition E (lead fatigue and tension tests are not applicable to surface mount "UR"
version devices).
C2
1071
Test condition E.
C2
1021
Omit initial conditioning.
C3
Not applicable.
C4
1041
As specified.
C5
Not applicable.
IZ = 7.5 mA dc, TA = +100°C. (see 4.5.2).
C6
1026
C7
Not applicable.
4.4.4 Group D inspection. Group D inspection shall be conducted in accordance with appendix E, table E-VIII of
MIL-PRF-19500. Submitted lots for group D sample inspection must be constructed using one homogeneous wafer
lot for the zener and one wafer lot for the compensating die, as also described in the submitted DSCC Design and
Construction form 36D (see table II herein).
4.4.5 Group E inspection. Group E inspection shall be conducted in accordance with the conditions specified for
subgroup tests in appendix E, table E-IX of MIL-PRF-19500 and table III herein.
4.5 Methods of inspection. Methods of inspection shall be as specified in the appropriate tables and as follows.
4.5.1 Voltage-temperature stability. The breakdown voltage of each diode type shall be measured and recorded at
each of the specified temperatures. The lowest measured voltage shall be subtracted from the highest measured
voltage for each diode. The difference value obtained shall not exceed the specified ΔVZ for each diode type.
4.5.2 Reference voltage time stability. The breakdown voltage shall be measured prior to life testing, at 340 hours,
and at the conclusion of the life test as shown in table IV. The 340-hour reading shall be compared with the 0-hour
reading and the 1,000-hour reading compared with the 340-hour reading. The change in breakdown voltage shall not
exceed the limits specified. The test temperature for breakdown voltage shall be the same as the specified ambient
life test temperature (see table IV herein).
4.5.3 Reference voltage. The test current shall be applied until thermal equilibrium is attained (15 seconds
minimum) prior to reading the reference voltage. For this test, the diode shall be suspended by its leads with
mounting clips whose inside edge is located between .375 inch (9.53 mm) and .500 inch (12.70 mm) inch from the
body and the mounting clips shall be maintained at the specified temperature. This measurement may be performed
after a shorter time following application of the test current than that which provides thermal equilibrium if correlation
to stabilized readings can be established to the satisfaction of the Government.
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