MIL-PRF-19500-159 Semiconductor Device, Diode, Silicon, Temperature Compensated, Voltage-Reference, Types 1N821-1, 1N823-1, 1N825-1, 1N827-1, And 1N829-1, 1N821Ur-1, 1N823Ur-1, 1N825Ur-1, 1N827Ur-1, And 1N829Ur-1, Jan, Jantx, Jantxv, Jans, Janhc And Jankc; Radiation Hardened \(Total Dose Only\) Types Jantxvm, D, L, R, F, G, H; Jansm, D, L, R, F, G, H; Janhcm, D, L, R, F, G, H; And Jankcm, ...This specification covers the performance requirements for 6.2 volts ┬▒5 percent, silicon, temperature compensated, voltage-reference diodes. Four levels of product assurance are provided for each encapsulated device type as specified in MIL-PRF-19500, and two levels of product assurance are provided for each unencapsulated device type. Seven levels of radiation hardened \(total dose only\) product assurance are provided for each encapsulated device type as specified in MIL-PRF-19500, and two levels of product assurance for each unencapsulated device type.

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MIL-PRF-19500/159P

4.3.1 Power burn-in conditions. Power burn-in conditions are as follows: IZ = 7.5 mA dc, 0.75 mA dc,

TA = +150C, +5C, -0C.

4.3.2 Screening (JANHC and JANKC). Screening of JANHC and JANKC die shall be in accordance with

MIL-PRF-19500.

4.4 Conformance inspection. Conformance inspection shall be in accordance with MIL-PRF-19500.

4.4.1 Group A inspection. Group A inspection shall be conducted in accordance with table E-V of MIL-PRF-19500

and table I herein.

4.4.2 Group B inspection. Group B inspection shall be conducted in accordance with the conditions specified for

subgroup testing in table E-VIa (JANS) and table E-VIb (JAN, JANTX, JANTXV, ) of MIL-PRF-19500. Electrical

measurements (end-points) shall be in accordance with the applicable steps of table I, subgroup 2 herein.

4.4.2.1 Group B inspection, table E-VIa (JANS) of MIL-PRF-19500. For purposes of JANS inspection, a single

device type shall be defined as devices from a single wafer lot (for each die type used in the construction). The

conformance inspection sample shall be selected from the part category with the lowest VZ rating in the inspection

lot.

Method

Conditions

Subgroup

2066

As specified.

2026

As specified.

1022

As specified.

1056

Test Condition A, 25 cycles.

4066

Not applicable.

1071

Test condition E.

2075

As specified.

1037

IZ = 35 mA dc at TA = room ambient; ton = toff = 30 seconds minimum for

4,000 cycles. Forced air cooling allowed during off cycle.

IZM = 70 mA dc for 96 hours. TA  +75C, adjust TA to achieve TJ = +200C

1027

minimum.

Not applicable.