For Parts Inquiries call (727) 344-9615
A Service Disabled Veteran Owned Small Business
© Copyright 2015 Integrated Publishing, Inc.

MIL-PRF-19500-159 Semiconductor Device, Diode, Silicon, Temperature Compensated, Voltage-Reference, Types 1N821-1, 1N823-1, 1N825-1, 1N827-1, And 1N829-1, 1N821Ur-1, 1N823Ur-1, 1N825Ur-1, 1N827Ur-1, And 1N829Ur-1, Jan, Jantx, Jantxv, Jans, Janhc And Jankc; Radiation Hardened \(Total Dose Only\) Types Jantxvm, D, L, R, F, G, H; Jansm, D, L, R, F, G, H; Janhcm, D, L, R, F, G, H; And Jankcm, ...This specification covers the performance requirements for 6.2 volts ┬▒5 percent, silicon, temperature compensated, voltage-reference diodes. Four levels of product assurance are provided for each encapsulated device type as specified in MIL-PRF-19500, and two levels of product assurance are provided for each unencapsulated device type. Seven levels of radiation hardened \(total dose only\) product assurance are provided for each encapsulated device type as specified in MIL-PRF-19500, and two levels of product assurance for each unencapsulated device type.

Pages 1 - 2 - 3 - 4 - 5 - 6 - 7 - 8 - 9 - 10 - 11 - 12 - 13 - 14 - 15 - 16


img
MIL-PRF-19500/159P
4.2 Qualification inspection. Qualification inspection shall be in accordance with MIL-PRF-19500 and as specified
herein.
4.2.1 Group E inspection. Group E inspection shall be conducted in accordance with MIL-PRF-19500 and 4.4.5
herein.
4.2.2 JANHC and JANKC devices. Qualification for JANHC and JANKC devices shall be in accordance with
MIL-PRF-19500.
4.2.2.1 Radiation hardened devices. See MIL-PRF-19500 and 4.4.4 herein.
* 4.3 Screening (JANS, JANTXV and JANTX levels only). Screening shall be in accordance with table E-IV of
MIL-PRF-19500, and as specified herein. Specified electrical measurements shall be made in accordance with table I
herein. Devices that exceed the limits of table I herein shall not be acceptable.
Screen
(see table E-IV of
JANS level
JANTXV and JANTX level
MIL-PRF-19500)
1a
Required
Not required
1b
Required
Required (JANTXV only)
2
Not required
Not required
3a
Required
Required
3b
Not applicable
Not applicable
3c
Not applicable
Not applicable
4
Not applicable
Not applicable
5
Not applicable
Not applicable
6
Not applicable
Not applicable
7a
Not applicable
Not applicable
7b
Optional
Optional
8
Required
Not required
9
Required
Not applicable
10
Not applicable
Not applicable
11
Required VZ, ZZ
Required VZ, ZZ
12
Required see 4.3.1
Required see 4.3.1
13
Required
Required
Subgroups 2 of table I herein; ZZ ±15
Subgroups 2 and 3 of table I herein;
ZZ ±15 percent of initial reading TA =
percent of initial reading TA = +25C ±2C,
+25C ±2C, VZ ±0.004 V dc from
VZ ±0.004 V dc from initial value for
initial value for 1N821-1, 1N821UR-1,
1N821-1, 1N821UR-1, 1N823-1, 1N823UR-
1N823-1, 1N823UR-1, 1N825-1
1, 1N825-1 1N825UR-1
VZ ±0.003 V dc from initial value for
1N825UR-1
VZ ±0.003 V dc from initial value for
1N827-1, 1N827UR-1, 1N829-1, 1N829UR-
1N827-1, 1N827UR-1, 1N829-1,
1
1N829UR-1
14a
Not applicable
Not Applicable
14b
Required (1) (2)
Required (1) (2)
15
Required
Not required
16
Required
Not required
(1) See MIL-PRF-19500.
(2) For clear glass diodes, the hermetic seal (gross leak) may be performed at any time after temperature cycling.
9



For Parts Inquires call Parts Hangar, Inc (727) 493-0744
© Copyright 2015 Integrated Publishing, Inc.
A Service Disabled Veteran Owned Small Business

© Copyright 2015 Integrated Publishing, Inc. Site Design & Marketing by Strategico.