MIL-PRF-19500/255Y
2. APPLICABLE DOCUMENTS
2.1 General. The documents listed in this section are specified in sections 3, 4, or 5 of this specification. This
section does not include documents cited in other sections of this specification or recommended for additional
information or as examples. While every effort has been made to ensure the completeness of this list, document
users are cautioned that they must meet all specified requirements of documents cited in sections 3, 4, or 5 of this
specification, whether or not they are listed.
2.2 Government documents.
2.2.1 Specifications, standards, and handbooks. The following specifications, standards, and handbooks form a
part of this document to the extent specified herein. Unless otherwise specified, the issues of these documents are
those cited in the solicitation or contract.
DEPARTMENT OF DEFENSE SPECIFICATIONS
MIL-PRF-19500
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Semiconductor Devices, General Specification for.
DEPARTMENT OF DEFENSE STANDARDS
MIL-STD-750
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Test Methods for Semiconductor Devices.
* (Copies of these documents are available online at https://assist.dla.mil/quicksearch or https://assist.dla.mil or
from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)
2.3 Order of precedence. Unless otherwise noted herein or in the contract, in the event of a conflict between the
text of this document and the references cited herein, the text of this document takes precedence. Nothing in this
document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained.
3. REQUIREMENTS
3.1 General. The individual item requirements shall be as specified in MIL-PRF-19500 and as modified herein.
3.2 Qualification. Devices furnished under this specification shall be products that are manufactured by a
manufacturer authorized by the qualifying activity for listing on the applicable qualified manufacturers list before
contract award (see 4.2 and 6.3).
* 3.3 Abbreviations, symbols, and definitions. Abbreviations, symbols, and definitions used herein shall be as
specified in MIL-PRF-19500 and as follows.
PCB ............................................. Printed circuit board.
RθJA .............................................. Thermal resistance junction to ambient.
RθJC .............................................. Thermal resistance junction to case.
RθJSP(AM) ....................................... Thermal resistance junction to solder pads (adhesive mount to PCB).
RθJSP(IS) ......................................... Thermal resistance junction to solder pads (infinite sink mount to PCB).
TSP(AM) .......................................... Temperature of solder pads (adhesive mount to PCB).
TSP(IS)............................................ Temperature of solder pads (infinite sink mount to PCB).
UA, .............................................. Surface mount case outlines (see figure 2).
*
UB, UBC, UBN, and UBCN.......... Surface mount case outlines (see figure 3).
* 3.4 Interface and physical dimensions. The interface and physical dimensions shall be as specified in
MIL-PRF-19500, and on figures 1, 2, 3, 4, 5, and 6 herein.
3.4.1 Lead finish. Lead finish shall be solderable in accordance with MIL-PRF-19500, MIL-STD-750, and herein.
Where a choice of lead finish is desired, it shall be specified in the acquisition document (see 6.2).
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