MIL-PRF-19500/255Y
4.4.2.2 Group B inspection, (JAN, JANTX, and JANTXV). Separate samples may be used for each step. In the
event of a lot failure, the resubmission requirements of MIL-PRF-19500 shall apply. In addition, all catastrophic
failures during CI shall be analyzed to the extent possible to identify root cause and corrective action. Whenever a
failure is identified as wafer lot or wafer processing related, the entire wafer lot and related devices assembled from
the wafer lot shall be rejected unless an appropriate determined corrective action to eliminate the failures mode has
been implemented and the devices from the wafer lot are screened to eliminate the failure mode.
Step
Method
Condition
Steady-state life: 1,000 hours minimum, VCB = 10 V dc, power shall be applied to achieve
1
1026
TJ = +150°C minimum using a minimum of PD = 75 percent of maximum rated PT as defined
in 1.3. n = 45 devices, c = 0. The sample size may be increased and the test time
decreased as long as the devices are stressed for a total of 45,000 device hours minimum,
and the actual time of test is at least 340 hours.
Blocking life, TA = +150°C, VCB = 80 percent of rated voltage, 48 hours minimum.
2
1048
n = 45 devices, c = 0.
High-temperature life (non-operating), t = 340 hours, TA = +200°C. n = 22, c = 0.
3
1032
4.4.2.3 Group B sample selection. Samples selected from group B inspection shall meet all of the following
requirements:
a. For JAN, JANTX, and JANTXV samples shall be selected randomly from a minimum of three wafers (or from
each wafer in the lot) from each wafer lot. For JANS, samples shall be selected from each inspection lot.
See MIL-PRF-19500.
b. Shall be chosen from an inspection lot that has been submitted to and passed table I, subgroup 2,
conformance inspection. When the final lead finish is solder, or any plating prone to oxidation at high
temperature, the samples for life test (subgroups B4 and B5 for JANS, and group B for JAN, JANTX, and
JANTXV) may be pulled prior to the application of final lead finish.
4.4.3 Group C inspection, Group C inspection shall be conducted in accordance with the test and conditions
specified for subgroup testing in table E-VII of MIL-PRF-19500, and in 4.4.3.1 (JANS) and 4.4.3.2 (JAN, JANTX, and
JANTXV) herein for group C testing. Electrical measurements (end-points) and delta requirements shall be in
accordance with table I, subgroup 2 and 4.5.3 herein; delta requirements only apply to subgroup C6.
*
4.4.3.1 Group C inspection (JANS), table E-VII of MIL-PRF-19500.
Subgroup
Method
Condition
*
C2
2036
Test condition E; (not applicable for UA, UB, UBC, UBN, and UBCN devices).
RθJA and RθJC only, as applicable (see 1.3) and in accordance with thermal impedance
C5
3131
curves.
1,000 hours at VCB = 10 V dc; power shall be applied to achieve TJ = +150°C minimum
C6
1026
and a minimum of PD = 75 percent of maximum rated PT as defined in 1.3 n = 45, c = 0.
The sample size may be increased and the test time decreased as long as the devices are
stressed for a total of 45,000 device hours minimum, and the actual time of test is at least
340 hours.
14
For Parts Inquires call Parts Hangar, Inc (727) 493-0744
© Copyright 2015 Integrated Publishing, Inc.
A Service Disabled Veteran Owned Small Business