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MIL-PRF-19500-255 Semiconductor Device, Transistor, Npn, Silicon, Switching, Types 2N2221A, 2N2221Al, 2N2222A, 2N2222Al, 2N2221Aua, 2N2222Aua, 2N2221Aub, 2N2222Aub, 2N2221Aubc, And 2N2222Aubc, 2N2221Aubn, 2N2222Aubn, 2N2221Aubcn, 2N2222Aubcn, Jan, Jantx, Jantxv, Jantxvm, Jantxvd, Jantxvp, Jantxvl, Jantxvr, Jantxvf, Jantxvg, Jantxvh, Jans, Jansm, Jansd, Jansp, Jansl, Jansr, Jansf, Jansg, ...This specification covers the performance requirements for NPN, silicon, switching transistors. Five levels of product assurance are provided for each encapsulated device type as specified in MIL-PRF-19500, and two levels of product assurance are provided for each unencapsulated device type. Provisions for radiation hardness assurance \(RHA\) to eight radiation levels is provided for JANTXV, JANS, JANHC, and JANKC product assurance levels. RHA level designators "M", "D", "P", "L", "R", "F", "G" and "H" are appended to the device prefix to identify devices, which have passed RHA requirements.

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MIL-PRF-19500/255Y
*  4.3 Screening (JANS, JANTX, and JANTXV levels only). Screening shall be in accordance with
table E-IV MIL-PRF-19500, and as specified herein. The following measurements shall be made in accordance with
table I herein. Devices that exceed the limits of table I herein shall not be acceptable.
Screen (see
table E-IV of
Measurement
MIL-PRF-19500)
JANS level
JANTX and JANTXV levels
2
Optional
Optional
3a
Required
Required
3b
Not applicable
Not applicable
(1) 3c
Thermal impedance (transient), method
Thermal impedance (transient), method
*
3131 of MIL-STD-750.
3131 of MIL-STD-750. (2)
(see 4.3.3)
(see 4.3.3)
4
Required
Optional
5
Required
Not applicable
8
Required
Not required
9
ICBO2, hFE4
Not applicable
10
48 hours minimum
48 hours minimum
11
ICBO2; hFE4;
ICBO2; hFE4
ĆICBO2 = 100 percent of initial value or 5
nA dc, whichever is greater.
ĆhFE4 = ±15 percent
12
See 4.3.2
See 4.3.2
13
Subgroups 2 and 3 of table I herein;
Subgroup 2 of table I herein;
ĆICBO2 = 100 percent of initial value or
ĆICBO2 = 100 percent of initial value or
5 nA dc, whichever is greater;
5 nA dc, whichever is greater;
ĆhFE4 = ±15 percent
ĆhFE4 = ±15 percent
15
Required
Not required
16
Required
Not required
(1) Thermal impedance limits shall not exceed figures 12, 13, 14, 15, and 16.
*
(2) Shall be performed anytime after temperature cycling, screen 3a; JANTX and JANTXV levels do not need to
be repeated in screening requirements.
12



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