MIL-PRF-19500/260L
3.4.2 Lead finish. Lead finish shall be solderable in accordance with MIL-PRF-19500, MIL-STD-750 and herein.
Where a choice of lead finish is desired, it shall be specified in the contract or order (see 6.2).
3.4.3 Diode construction. All devices shall be in accordance with the requirements of MIL-PRF-19500 and herein.
3.5 Marking. Marking shall be in accordance with MIL-PRF-19500.
3.5.1 Polarity. The polarity shall be indicated by a graphic symbol with the arrow pointing toward the negative end
for forward bias. The reversed units shall also be marked with an R, AR, or RA suffix in the part number.
3.6 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance
characteristics are as specified in 1.3, 1.4, and table I herein.
3.7 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table I herein.
3.8 Workmanship. Semiconductor devices shall be processed in such a manner as to be uniform in quality and
shall be free from other defects that will affect life, serviceability, or appearance.
4. VERIFICATION
4.1 Classification of inspections. The inspection requirements specified herein are classified as follows:
a. Qualification inspection (see 4.2).
b. Screening (see 4.3).
c. Conformance inspection (see 4.4).
4.1.1 Sampling and inspection. Sampling and inspection shall be in accordance with MIL-PRF-19500 and herein,
except for accumulation period shall be 3 months in lieu of 6 weeks.
4.2 Qualification inspection. Qualification inspection shall be in accordance with MIL-PRF-19500 and herein.
Tests in either polarity shall be sufficient to obtain approval of both polarities.
4.2.1 JANHC and JANKC devices. Qualification for JANHC and JANKC devices shall be in accordance with
MIL-PRF-19500.
4.2.2 Group E qualification. Group E inspection shall be performed for qualification or re-qualification only. In
case qualification was awarded to a prior revision of the specification sheet that did not request the performance of
table II tests, the tests specified in table II herein that were not performed in the prior revision shall be performed on
the first inspection lot of this revision to maintain qualification.
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