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MIL-PRF-19500-260 Semiconductor Device, Diode, Silicon, Power Rectifier, Types 1N1202A, 1N1204A, 1N1206A, 1N3671A, 1N3673A, And Ar Versions, Jan, Jantx, Jantxv, Jans, Janhc, And Jankc, 1N1124A, 1N1126A, 1N1128A, 1N3649, 1N3650, 1N1124Ra, 1N1126Ra, 1N1128Ra , 1N3649R, And 1N3650R, Jan OnlyThis specification covers the performance requirements for silicon semiconductor power rectifier diodes. Four levels of product assurance are provided for each encapsulated 1N1202A, 1N1204A, 1N1206A, 1N3671A, 1N3673A device type as specified in MIL-PRF-19500, and two levels of product assurance for each unencapsulated device type. One level of product assurance is provided for each device type as specified in MIL-PRF-19500, for the 1N1124A, 1N1126A, 1N1128A, 1N3649, 1N3650. For normal and reverse \(A, R, RA, and AR suffix\) type devices see 3.4.1.

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MIL-PRF-19500/260L
4.5.2 Burn-in and steady-state operation life tests. These tests shall be conducted with a half-sine waveform of
the specified peak voltage impressed across the diode in the reverse direction followed by a half-sine waveform of
the specified average rectifier current. The forward conduction angle of the rectified current not be greater than 180
degrees nor less than 150 degrees.
4.5.3 DC intermittent operation life. A cycle shall consist of an on period, when power is applied suddenly, not
gradually, to the device for the time necessary to achieve a delta case temperature of 85°C +15°C -5°C followed by
an off period, when the power is suddenly removed, for cooling. Auxiliary (forced) cooling is permitted during the off
period only. 30 s < tHeating < 60 s, P = VF x IF or P = VFPK x Iav if using sine wave current. DC full wave current (or
equivalent half sine wave current) shall be used for the power required during the on period. The test power, or
current, shall be at least the free air rating. Within the time interval of 50 cycles before to 500 cycles after the
termination of the test, the sample units shall be removed from the specified test conditions and allowed to reach
room ambient conditions. Specified end-point measurements for qualification and quality conformance verification
shall be completed within 96 hours after removal of sample units from the specified test conditions. Additional
readings may be taken at the discretion of the manufacturer.
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